Sampled data-acquisition systems using high-speed analog-to-digital converters (ADCs), such as those in communications infrastructure and electrical test-and-measurement applications, continue to have insatiable performance requirements for high signal-to-noise ratio (SNR) and low noise spectral density (NSD). While ADC design teams continue to turn out world-class converters, system engineers will continue to look for the last +3 dB of increased SNR and –3-dB reduction in NSD...
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