Why You Should be Using Critical Area Analysis and DFM Scoring (.PDF Download)

Whether you’re using a leading-edge process node to manufacture a very large system-on-chip (SoC), or using an established node for automotive or Internet of Things (IoT) electronics, critical area analysis (CAA) and design-for-manufacturing (DFM) scoring are valuable techniques that can be used to improve the manufacturability, reliability, and (oh, yeah) the profitability of your products.

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