EE Product News

Vision Tool Detects Defects

Developed for the detection and classification of defects on objects, PatInspect is a machine vision software tool that is said to perform far beyond the capabilities of previous machine vision inspection technologies. Incorporating the firm's PatMax object location technology, the program accurately finds defects on an object, even when it has been rotated or its scale has been changed from the original, trained position. It can also reliably detect flaws along the edges of an object. In semiconductor manufacturing, the software can accurately inspect die, lead frames, probe marks, and IC marks for defects. It can also be used for a variety of general manufacturing applications such as inspecting the quality of print on packages and bottles. The software runs on any of firm's Checkpoint 900 or MVS-8000 vision systems.

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