Test System Capable of 125 MHz

The Delta/STE provides functional test capabilities at 125 MHz and I/O bus speeds to 250 MB/s, with multisite testing on two test heads. It addresses test challenges posed by the emerging generation of low-cost, complex, single-chip multimedia devices.

The 512-pin system integrates the analog test technology of the company’s Synchro Series of mixed signal systems in a low-noise test head close to the device under test. Functions include 18-bit capability for audio, frequency control, time measurement, device jitter measurement and asynchronous event timing. From under $5,000 per pin. LTX, (617) 461-1000.

Copyright 1996 Nelson Publishing Inc.

October 1996