The J996 Memory Test System is designed for engineering characterization and production test of RAMs operating at speeds up to 250 MHz, including standard DRAMs, synchronous DRAMs and synchronous SRAMs. As many as 64 devices with 16 I/O pins each can be tested in parallel at package test.
The system has an overall timing accuracy of ±375 ps and an edge placement accuracy of ±175 ps. There are 512 I/O channels per test head and the J996 can be configured with two test heads. The J996, which runs on the company’s IG900+ software, can be bought in several configurations and upgraded as needed. Teradyne, (818) 991-2900.
Copyright 1997 Nelson Publishing Inc.
February 1997
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