Two new models join the Marlin-platform memory test systems for advanced RAMs operating at speeds up to 250 MHz including standard DRAMs, synchronous DRAMs and synchronous SRAMs. For error capture and failure processing, the J996FA and the J996E provide up to 5.12 G and 2.56 G, respectively, of Catch RAM per test head.
The J996FA is optimized for wafer probing with hardware and software tools for failure analysis and redundancy repair analysis. With this system, as many as 64 devices with 16 I/O pins each can be tested in parallel at wafer probe.
The J996E accommodates high-performance engineering characterization and silicon debug. Both systems use the company’s IG900+ software with graphical engineering software tools and templates for production testing. J996FA: starts at $1.6 million; J996E: starts at $1.4 million. Teradyne Memory Test Division, (818) 991-2900.
Copyright 1997 Nelson Publishing Inc.