System Tests SRAMs at Probe Stage

The T5581P is a 250-MHz test system for at-speed probe of synchronous RAMs. It tests features such as latency, burst modes, double data rate, and logic function capabilities for applications such as characterization, evaluation, and known-good-die tests.

A compact BiCMOS test head provides accurate, rapid probe contact while minimizing the tester footprint. The direct-dock overhead probe design incorporates the company’s precision docking interface. Edge-placement accuracy of the T5581P is 180 ps, and the minimum pulse width is 2 ns. It handles pin counts up to 288 I/O. Starts at $1.3 million. Advantest America, (847) 634-2552.

Copyright 1997 Nelson Publishing Inc.

October 1997

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