The DarkHorse SIGMA·3™ Memory Tester for 100-MHz SDRAM modules is designed for high-volume production environments. It detects and locates manufacturing defects in SDRAM modules of all speeds as well as asynchronous DRAM, flash, and SGRAM memories.
The system accommodates 80 data bits (160 optional), 32 address lines, 32 control lines, and 3.3- and 5-V TTL drivers. It offers moveable timing edges on all controls and AC parametric testing.
SIGMA
·3 is fully software upgradeable to handle future architectures such as Rambus, Double Data Rate, and SLDRAM. Companion handling equipment, labeling equipment, and adapters are available for most test applications. The SIGMA·3 comes with a Windows 95 interface. Starts at $100,000. Tanisys Technology, (800) 567-0889.
Copyright 1998 Nelson Publishing Inc.
May 1998
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