The DX2001 Production Memory Tester accommodates 64-M, 128-M, and 256-M SDRAM and double data rate (DDR) memories. As many as 64 devices may be tested simultaneously at up to 333 Mb/s. It includes an algorithmic pattern generator for multibank memories and performs parallel IDD and IDDQ measurements.
Key features are ±125-ps edge-placement accuracy, up to seven strobes per cycle, per-pin independent programmable levels and strobes, and Sequencer per Function™ timing. The liquid-cooled system uses Advanced Symbolic ATE Programming tools to speed up test-program development.
The DX2001 provides full integration with device handlers and CIM tools. Jitter is <75 ps. From $1.2 million.
Schlumberger ATE, (408) 501-7145.
Copyright 1998 Nelson Publishing Inc.
October 1998
