The Vanguard Engineering Station features 500-MHz Cycle Ratio Enabled System Timing (CREST) architecture for testing complex digital devices. It can be configured with up to 16 500-MHz clocks and up to 512 I/O pins, each supporting 500 Mbits/s data rates.
The mobile station tests first silicon and characterizes device performance and performs production failure analysis and yield enhancement. The CREST architecture helps generate patterns with cycle shrink or cycle stretch by changing the cycle time and edge placement on-the-fly.
With Vanguard’s interactive software, you can view test conditions and results on-screen. It provides simultaneous real-time comparison and acquisition with 1-MB acquisition memory on each pin for pin-by-pin and vector-by-vector information after a single execution of the test. Starts at $550,000. Integrated Measurement Systems, (503) 626-7117.
Copyright 1998 Nelson Publishing Inc.
December 1998