ACPR adjacent channel power ratio
ADC analog-to-digital converter
ADSL asymmetrical DSL
AM amplitude modulation
AMPS advanced mobile phone service
ANSI American National Standards Institute
API application programming interface
Arb arbitrary waveform generator
ASIC application-specific integrated circuit
ATE automatic test equipment
ATM asynchronous transfer mode
ATPG automatic test program generator
BERT bit error rate test
BGA ball grid array
BISR built-in self-repair
BIST built-in self-test
BITE built-in test equipment
BPSK binary phase-shift keying
CAMAC computer-automated measurement and control
CCDF complementary CDF
CD compact disk
CDF cumulative distribution function
CDMA code division multiple access
CD-ROM compact disk read-only memory
CMRR common-mode rejection ratio
CODEC coder/decoder
COTS commercial off-the-shelf
CPU central processor unit
CRC cyclic redundancy check
DAC digital-to-analog converter
dBm decibels relative to 1 mW
dBV decibels relative to 1 V
DDR double data rate
DFT design for test
DLL dynamic link library
DMA direct memory access
DRAM dynamic RAM
DSL digital subscriber line
DSO digital storage oscilloscope
DSP digital signal processor
DUT device under test
DWDM dense WDM
EISA extended ISA (bus)
EMC electromagnetic compatibility
EMI electromagnetic interference
EOS electrical overstress
ESD electrostatic discharge
ESS environmental stress screening
FDDI fiber-distributed data interface
FEA finite element analysis (software)
FFT fast Fourier transform
FIB focused ion beam
FIFO first-in, first out (buffer)
FIR finite impulse response (filter)
FM frequency modulation
FTP file transfer protocol
GMR giant magnetoresistive
GMSK Gaussian minimum shift keying
GPIB general-purpose interface bus
GPS global positioning system
GSM global system for mobile communications
GTEM gigahertz transverse electromagnetic
GUI graphical user interface
HALT highly accelerated life test
HASS highly accelerated stress screening
HTML hypertext markup language
HTTP hypertext transfer protocol
ICT in-circuit tester
IEEE Institute of Electrical and Electronics Engineers
ISA industry standard architecture (bus)
ISDN integrated services digital network
IVI interchangeable virtual instruments
JEDEC Joint Electron Device Engineering Council
JTAG Joint Test Action Group
LCC leadless chip carrier
LCD liquid crystal display
µBGA micro-BGA
MCM multichip module
MDA manufacturing defects analyzer
MEMS microelectromechanical system
MR magnetoresistive
MTBF mean time between failures
MTTR mean time to repair
MUX multiplexer
MXI multisystem extension interface
NIST National Institute of Standards and Technology
NVM nonvolatile memory
OATS open-area test site
OTDR optical time-domain reflectometer
PCI peripheral component interconnect (bus)
PCM pulse code modulation
PCMCIA Personal Computer Memory Card International Association
PDF probability distribution function
POTS plain old telephone system
PSD power spectral density
PSK phase-shift keying
PXI PCI extensions for instrumentation
QFP quad flat pack
QPSK quadrature phase shift keying
RAM random access memory
RDRAM Rambus dynamic RAM
RFI radio frequency interference
RISC reduced instruction set computer
ROM read-only memory
SAE Society of Automotive Engineers
SCADA supervisory control and data acquisition
SCPI standard commands for programmable instruments
SDH synchronous digital hierarchy
SNR signal-to-noise ratio
SOC system on a chip
SONET synchronous optical network
SPICE simulation program with integrated circuit emphasis
SQL structured query language
TCP/IP transmission control protocol/Internet protocol
TDMA time division multiple access
TEM transverse electromagnetic
THD total harmonic distortion
UDP user datagram protocol
UDWDM ultra-DWDM
UPS uninterruptible power supply
USB universal serial bus
VGA video graphics array
VNA vector network analyzer
VXI VMEbus extensions for instrumentation
W-CDMA wideband code division multiple access
WDM wavelength division multiplexing
WORM write once, read many (times)
xDSL digital subscriber line (x represents A, H, or M,
for example)
Published by EE-Evaluation Engineering
All contents © 2000 Nelson Publishing Inc.
No reprint, distribution, or reuse in any medium is permitted
without the express written consent of the publisher.
December 2000