You’re right if you think the Internet is filled with useful information. The problem is how to find the application notes, technical notes, or white papers that address your needs. That’s where EE-Evaluation Engineering can help.
As a service to you, we asked leading companies in the electronics test industry to tell us what technical information they had prepared and published during the last two years. The listings that follow are representative of their responses.
The information is categorized in seven major groups including ATE, Semiconductor and IC Test, PC-Based Test, Software, Instrumentation, Communications Test, and Environmental Test. Within each category, the information is organized by company name. And we’ve made it easy for you to go directly to the notes and white papers that are on the Internet by entering a www.rsleads.com/212ee-xxx URL. If the note or white paper is available only in printed form, the phone number of the company is listed so you can order the note or paper.
Of course, there are exceptions. A few sites require you to register before accessing the technical information. However, for all the companies listed here, access after registration is immediate.
Some companies list magazine sites as locations where you can download an article. This approach works initially, but as time goes by, older issues may not be available on the magazine’s site. Similarly, articles that appeared in technical journals or were presented at conferences often are not freely accessible on line. Phoning the company is the best way to find an article.
Other than those small inconveniences, browse away. Generally, application notes describe how to use a specific product to solve a problem. Technical notes may discuss a product feature, or they can be more generic and theoretical. White papers are the most unbiased of all three categories and usually present a technical discussion related to a new product, process, or technology.
On the other hand, don’t judge a book by its cover. Definitions vary widely among companies, so reading at least the introduction or abstract is the best way to decide if the topic is for you. We limited the number of entries from each company, but many web sites have hundreds of well-researched and timely technical papers. Happy surfing!
ATE
Advantest America
- New High-Speed, High-Density MEMS-Based Probe Technology, 847-821-3204
- Advanprobe Technology, 847-821-3204
- Advantest’s PhotoFinger™ Probecard, 847-821-3204
- High-Density Photolithographic Advanprobe Technology, 847-821-3204
Agilent Technologies
- Notebook Manufacturer Finds Margin in the Details, www.rsleads.com/212ee-417
- Agilent Pay-Per-Use Model Slashes Manufacturing Test Costs for Ascom, www.rsleads.com/212ee-418
- Nokia Improves Call Accuracy and Increases Test Confidence With Agilent’s BGA Opens Detector, www.rsleads.com/212ee-419
- In the Fast Lane: Digitek Sets Pace for Product Quality With X-Ray Test, www.rsleads.com/212ee-420
- Barcoprojection Improves Quality and Shortens Time-to-Market With Agilent X-Ray Test Technology, www.rsleads.com/212ee-421
- Turned On: Notebook Manufacturers Implement X-Ray Test Strategy and Improve Quality, www.rsleads.com/212ee-422
- HP, Nortel, and Plexus Successfully Power-Up Prototypes With X-Ray Test, www.rsleads.com/212ee-423
- Good Call: Cell Phone Manufacturers Adopt X-Ray Test, www.rsleads.com/212ee-424
- X-Ray Test: Highest Test Effectiveness Ensures End-Product Quality, www.rsleads.com/212ee-425
- Global Data Storage Leader Standardizes on Agilent 5DX for Prototyping and Volume Manufacturing, www.rsleads.com/212ee-426
- Advanced Energy Industries, Inc. Adopts Agilent 3070 In-Circuit Test With Microsoft Windows Operating System, www.rsleads.com/212ee-427
- Agilent 3070 Board Tests Are Reliable, Repeatable, and Transportable. Here’s Why. www.rsleads.com/212ee-428
- Improved Fault Coverage in a Combined X-Ray and In-Circuit Environment [Using Agilent AwareTest xi], www.rsleads.com/212ee-430
- Life and Stability of the Agilent 5DX Sealed X-Ray Tube, www.rsleads.com/212ee-431
- Ground Bounce Basics and Best Practices, www.rsleads.com/212ee-432
- Electrical In-Circuit Test Methods for Limited Access Boards, www.rsleads.com/212ee-433
- Comparing AOI and AXI: Which Is Right for You? www.rsleads.com/212ee-434
- The Why, Where, What, How, and When of Automated X-Ray Inspection, www.rsleads.com/212ee-435
- Year 1999 Defect Study and Fault Spectrum Study (One Billion Solder Joints and Counting), www.rsleads.com/212ee-436
CableTest Systems
- Mass Hipot Testing for Wire Harnesses, www.rsleads.com/212ee-449
- Introduction to Cable Testing, www.rsleads.com/212ee-450
Credence
- Optimized Engineering Validation Test Systems Improve Time-to Market, Cost, and Quality of Complex Systems, 510-492-3159
- Reducing Risks in Outsource Services, 510-492-3159
- Managing RFIC Test Challenges for 3G Services, 510-492-3159
Digalog Systems
- Design for Testability and the Effects on Fixture Fabrication, www.rsleads.com/212ee-751
- Methodizing Functional Test Programs, www.rsleads.com/212ee-752
Dynalab
- Fixture Clamp Activation, 614-866-9999
- How to Prevent Removal of Harness From Fixture Before Testing Is Completed, 614-866-9999
- Random Continuity Testing, 614-866-9999
Keithley Instruments
- Configuring an Optimal RF/Microwave Switch System, www.rsleads.com/212ee-614
Mentor Graphics
- Embedded Deterministic Test-DFT Technology for Low-Cost IC Manufacturing Test, www.rsleads.com/212ee-657
- TestKompress™ With EDT™ Technology: Reducing Time and Expense in Test, www.rsleads.com/212ee-658
- Reducing Simulation Mismatches in Design-for-Test (DFT) Implementation, www.rsleads.com/212ee-659
- ATPG Pattern Compaction-The Next Wave www.rsleads.com/212ee-661
- Scan-Based At-Speed Testing for the Fastest Chips, www.rsleads.com/212ee-663
National Instruments
- Personal ATE-Bringing ATE to the Desktop, www.rsleads.com/212ee-720
SPEA spa
- 4040: The Flying Probe That Has No Obstacles, 01139 011 9825400
- Access the Inaccessible? Possible With Flying Probe Tester, 01139 011 9825400
- Flying Probe Test System: SPEA Launches the 3rd Generation, 01139 011 9825400
- Innovative Test Solution for LCD Drivers, 01139 011 9825400
VXI Technology
- Contract Manufacturing Functional Test Subsystem, www.rsleads.com/212ee-717
- Configuring Functional ATE Systems www.rsleads.com/212ee-718
Semiconductor Test/IC Test
Innoventions
- Ramcheck Plus Device Structure Analysis, www.rsleads.com/212ee-578
- Customer-Made Adapters for Ramcheck, www.rsleads.com/212ee-579
- Simcheck II Application Notes Applicable to Ramcheck, www.rsleads.com/212ee-580
- Ramcheck Support of CAS Latency 2 Modules, www.rsleads.com/212ee-581
- Memory Test Algorithms and Test Accuracy, www.rsleads.com/212ee-582
- Ramcheck Error Codes, www.rsleads.com/212ee-583
- Ramcheck’s Use of Page Burst Mode, www.rsleads.com/212ee-584
- Upgrading SIMCHECK II Adapters to the New Ramcheck Level, www.rsleads.com/212ee-585
- RAMCHECK DDR Series Manual Addendum, www.rsleads.com/212ee-586
- Ramcheck SPD Management Manual Addendum, www.rsleads.com/212ee-587
Mentor Graphics
- Embedded Deterministic Test-DFT Technology for Low-Cost IC Manufacturing Test, www.rsleads.com/212ee-657
- TestKompress™ With EDT™ Technology: Reducing Time and Expense in Test, www.rsleads.com/212ee-658
- Reducing Simulation Mismatches in Design-for-Test (DFT) Implementation, www.rsleads.com/212ee-659
- ATPG Pattern Compaction-The Next Wave, www.rsleads.com/212ee-661
- Scan-Based At-Speed Testing for the Fastest Chips, www.rsleads.com/212ee-663
PC-Based Test
Advantest America
- New High-Speed, High-Density MEMS-Based Probe Technology, 847-821-3204
- Advanprobe Technology, 847-821-3204
- Advantest’s PhotoFinger™ Probecard, 847-821-3204
- High-Density Photolithographic Advanprobe Technology, 847-821-3204
Cami Research
- CableEye® Applications Guide, www.rsleads.com/212ee-453
Computer Aided Solutions
- Event Triggered Data Acquisition With Adwin, www.rsleads.com/212ee-454
- Synchronized High-Speed Image Capture With Adwin, www.rsleads.com/212ee-455
- Using Adwin as a Multi-Channel Trigger Controller, www.rsleads.com/212ee-456
- PID Control With Adwin, www.rsleads.com/212ee-457
- Adwin Systems for Test Automation in Development and Production, www.rsleads.com/212ee-458
Gage Applied
- Laser Transient Absorption Spectroscopy, www.rsleads.com/212ee-531
- Monitoring Modems for Traffic Lights, www.rsleads.com/212ee-532
- Chip Testing for Cordless Phones, www.rsleads.com/212ee-533
- Testing Digital ASIC Devices, www.rsleads.com/212ee-534
- Network IC Testing, www.rsleads.com/212ee-535
- Neutrino Detection System, www.rsleads.com/212ee-536
- Electron-Beam Steering (Feedback-Loop) for Scanning Lithography, www.rsleads.com/212ee-537
- High-Speed Data Acquisition Enables Infrared Imaging at One Million Frames per Second, www.rsleads.com/212ee-538
Geotest-Marvin Test Systems
- Dynamic Testing of Microprocessor-Based Products, www.rsleads.com/212ee-539
- Design for Testability Using Emulation-Based ATE, www.rsleads.com/212ee-540
- PC-Based Technology in Harsh Environments, www.rsleads.com/212ee-541
GOEPEL Electronic
- IEEE 1149.1 (Boundary Scan) Tutorial, www.rsleads.com/212ee-545
- End the Confusion of Tongues (IEEE 1532), www.rsleads.com/212ee-547
- Features to Improve Market Time, www.rsleads.com/212ee-548
- How to Develop Your First Boundary Scan Test Program, www.rsleads.com/212ee-549
Interactive Circuits and Systems
- The Importance of COTS Hardware in the Implementation of Modern-Day Sonar SIM/STIM Systems, www.rsleads.com/212ee-588
- High-Speed Arbitrary Waveform Generation, www.rsleads.com/212ee-589
- High-Speed Arbitrary Waveform Generation, www.rsleads.com/212ee-590
- Eliminating the Analog RF DownConverter for a VHF Receiver Using COTS Software Radio Products, www.rsleads.com/212ee-591
- The ICS-564 4-Channel, 14-bit, 100-MHz DAC PMC Module With Integrated Digital Upconverter and PCI 64/66 Interface, www.rsleads.com/212ee-592
- The ICS-554 4-Channel, 14-bit, 105-MHz ADC PMC Board With DownConverters and Xilinx FPGA, www.rsleads.com/212ee-593
- The Next-Generation Software Radio Modules, www.rsleads.com/212ee-595
- ICS daqPC for the Ultimate in Acquisition, Archiving, and Processing, www.rsleads.com/212ee-596
- Precision in PCI, www.rsleads.com/212ee-597
JTAG Technologies
- Hierarchical Boundary Scan-A Scan Chip-Set Solution, 425-898-8968
- Boundary-Scan Tool Supports Massively Parallel Programming, 425-898-8968
- In-System PLD Programming Using Boundary-Scan (JTAG), www.rsleads.com/212ee-600
- JTAG Visualizer Makes Boundary Scan Visible, 425-898-8968
- IEEE-1149.x Standards: Achievements vs. Expectations, 425-898-8968
- Boundary Scan, a Low-Cost, High-Performance Alternative for Testing Limited-Access PCBs, 425-898-8968
- Boundary Scan’s Next Plateau: Testing and In-System Configuration at the System Level, 425-898-8968
- Boundary Scan Controllers Summary, 425-898-8968
- Visualizing Boundary Scan, 425-898-8968
- Bridges Enhance System Boundary Scan, 425-898-8968
- JTAG Test, 425-898-8968
- Why Use “JTAG” for Testing and In-System Programming, an Executive Summary of Recent Advances in Test Technology, 425-898-8968
- Integrated Test Technologies to Improve Yields and Reduce Cost to Test, 952-920-7682
Microstar Laboratories
- High-Accuracy Turbine Rotor Measurements Save $150,000 Per Bad Part, www.rsleads.com/212ee-666
- Data Acquisition Processor Plays Role in Unique Infrastructure Monitoring System, www.rsleads.com/212ee-667
- Data Acquisition Technology Permits Fast Optical Recording for Studies of Causes of Sudden Cardiac Death, www.rsleads.com/212ee-668
- First Realistic Off-Vehicle Testing of Transmission Components, www.rsleads.com/212ee-669
- Data Acquisition Processor Helps Provide In-Place Diagnosis of Control Valves, www.rsleads.com/212ee-670
- Data Acquisition Technology Helps Further Improve Sound Quality of Pianos, www.rsleads.com/212ee-671
- Data Acquisition Processor Halves Cost of Multiscan Auto Seat Tester, www.rsleads.com/212ee-672
- Data Acquisition Technology Is Key to Sonar Detection of Fish Size and Species in Real Time, www.rsleads.com/212ee-673
- Test Flight, www.rsleads.com/212ee-674
- A Dummy With Brains, www.rsleads.com/212ee-675
- DAP Application: Model Suspension System www.rsleads.com/212ee-676
National Instruments
- Data Acquisition Fundamentals, www.rsleads.com/212ee-719
- Creating Bus-Independent Mixed I/O Test Systems, www.rsleads.com/212ee-725
Quatech
- Choices in Serial Connectivity Technologies for Retail, Banking, and Industrial Applications, www.rsleads.com/212ee-683
Software
GOEPEL Electronic
- IEEE 1149.1 (Boundary Scan) Tutorial, www.rsleads.com/212ee-545
- End the Confusion of Tongues (IEEE 1532), www.rsleads.com/212ee-547
- Features to Improve Market Time, www.rsleads.com/212ee-548
- How to Develop Your First Boundary Scan Test Program, www.rsleads.com/212ee-549
ICS Electronics
- GPIB – 101, www.rsleads.com/212ee-550
- Controlling Serial Temperature Controllers From GPIB Bus, www.rsleads.com/212ee-551
- Controlling Modbus Devices From the GPIB Bus, www.rsleads.com/212ee-552
- Using 488-PCI Cards in a Non-Controller Application, www.rsleads.com/212ee-553
- Using LabView With 4864 GPIB Relay Interfaces, www.rsleads.com/212ee-554
- Wayne-Kerr Screen Capture Utility, www.rsleads.com/212ee-555
JTAG Technologies
- Hierarchical Boundary Scan-A Scan Chip-Set Solution, 425-898-8968
- Boundary Scan Tool Supports Massively Parallel Programming, 425-898-8968
- JTAG Programming of PLDs and Flash Memories “In System”, www.rsleads.com/212ee-600
- JTAG Visualizer Makes Boundary Scan Visible, 425-898-8968
- IEEE-1149.x Standards: Achievements vs. Expectations, 425-898-8968
- Boundary Scan, a Low-Cost, High-Performance Alternative for Testing Limited-Access PCBs, 425-898-8968
- Boundary Scan’s Next Plateau: Testing and In-System Configuration at the System Level, 425-898-8968
- Boundary Scan Controllers Summary, 425-898-8968
- Visualizing Boundary Scan, 425-898-8968
- Bridges Enhance System Boundary Scan, 425-898-8968
- JTAG Test, 425-898-8968
- Why Use “JTAG” for Testing and In-System Programming, an Executive Summary of Recent Advances in Test Technology, 425-898-8968
- Integrated Test Technologies to Improve Yields and Reduce Cost to Test, 952-920-7682
- Design for Test Guidelines for Board Testing and In-System Configuration, 877-367-5824
- Design for Test Guidelines for System-Level Testing and In-System Configuration, 877-367-5824
The MathWorks
- System-Level Design for Programmable and Reconfigurable DSP Architectures, 508-647-7000
- Bluetooth Voice Simulink Model, 508-647-7000
- Fast-Converging CMA-Based Blind Equalization Algorithm for QAM Modems, 508-647-7000
- SCORT-New Bluetooth Packet Type for 802.11b Interference Avoidance, 508-647-7000
- Modeling DC Power Distribution in an Automatic Train Control, 508-647-7000
- Analyze, Model, Validate, Deploy: A Better Approach to Model-Based Design, 508-647-7000
Mentor Graphics
- Co-Verification: From Tool to Methodology, www.rsleads.com/212ee-652
- The Right Verification Strategy for You, www.rsleads.com/212ee-653
- The Waking of the Sleeping Giant-Verification, www.rsleads.com/212ee-654
- Is Silicon “Free”? Design Rule Checking and its Impact on System Design, www.rsleads.com/212ee-655
- QuickUse Part Request and Tracking System, www.rsleads.com/212ee-656
- Embedded Deterministic Test-DFT Technology for Low-Cost IC Manufacturing Test, www.rsleads.com/212ee-657
- TestKompress™ With EDT™ Technology: Reducing Time and Expense in Test, www.rsleads.com/212ee-658
- Reducing Simulation Mismatches in Design-for-Test (DFT) Implementation, www.rsleads.com/212ee-659
- Using FastScan Diagnostics to Improve Time-to-Volume, www.rsleads.com/212ee-660
- ATPG Pattern Compaction-The Next Wave, www.rsleads.com/212ee-661
- Testing Large-Capacity CAM With MBISTArchitect and FastScan, www.rsleads.com/212ee-662
- Scan-Based At-Speed Testing for the Fastest Chips, www.rsleads.com/212ee-663
- Designs With Multiple Clock Domains: Avoiding Clock Skew and Reducing Pattern Count Using DFTAdvisor and FastScan, www.rsleads.com/212ee-664
National Instruments
- Developing Remote Front-Panel LabVIEW Application, www.rsleads.com/212ee-721
- Microsoft’s Latest Programming Language: Visual C#, www.rsleads.com/212ee-722
- TestStand 2.0.1-Reducing the Cost of Manufacturing Test, www.rsleads.com/212ee-723
Instrumentation
Anritsu
- Hot S22 and Hot K-factor Measurements (HATS), www.rsleads.com/212ee-745
- Three- and Four-Port S-parameter Measurements, www.rsleads.com/212ee-746
Associated Research
- An Explanation of Fail Verification, www.rsleads.com/212ee-443
- SmartGFI vs. Conventional GFI, www.rsleads.com/212ee-444
- Enhanced User Interface, www.rsleads.com/212ee-445
Bustronic
- 2002 VME Reference Guide, www.rsleads.com/212ee-446
- 2002 CompactPCI Reference Guide, www.rsleads.com/212ee-447
California Instruments
- Understanding AC Source Specifications and Terminology, www.rsleads.com/212ee-452
Data Device
- Total COTS Solutions for Embedded 1553, www.rsleads.com/212ee-463
- Testing and Troubleshooting Synchro/Resolver Converters, www.rsleads.com/212ee-464
Datum
- How Sync Works, www.rsleads.com/212ee-472
- Cesium as an Alternative to GPS, www.rsleads.com/212ee-473
- TSG Output to NE Arrangement Reliability Comparison, www.rsleads.com/212ee-474
- TimePieces Sync Applications in Global Multiservice Networks, www.rsleads.com/212ee-475
- Success Story: Maple Optical Systems, Inc., www.rsleads.com/212ee-476
- Multiservice NE Clock Controllers and Line Card Timing Interfaces, www.rsleads.com/212ee-477
Dewetron
- Sensors and Signal Conditioners: Which Ones Go Together?, www.rsleads.com/212ee-495
Fluke
- Achieving the Best Results With Precision Digital Multimeter Measurements, www.rsleads.com/212ee-519
- Fully Automated Frequency/Time Interval Counter Calibration, www.rsleads.com/212ee-520
- Automated Batch Temperature Probe Calibration, www.rsleads.com/212ee-521
- The Effectiveness of Artifact Calibration in Computing Internal Resistance, www.rsleads.com/212ee-522
- Future Developments in Oscilloscope Calibration, www.rsleads.com/212ee-523
- Guiding Your Organization Through Laboratory Accreditation: A Technical Manager’s Experience, www.rsleads.com/212ee-524
- Improving Accuracy of Power and Power Quality Measurements, www.rsleads.com/212ee-525
- Modern Precision Multimeter Measurements-Putting Theory to the Test, www.rsleads.com/212ee-526
- Predictability of Solid-State Zener References, www.rsleads.com/212ee-527
- A Traceability Technique for Complex Waveform Generators, www.rsleads.com/212ee-528
- Verifying Precision Voltage Dividers and High Resistance Ratio Bridges Using a Josephson Voltage Standard, www.rsleads.com/212ee-529
- Widening the Calibration Bandwidth, www.rsleads.com/212ee-530
IFR, an Aeroflex Company
- Spectrum Analyzer Operation Using a Computer and Easyspan II Software, www.rsleads.com/212ee-570
Keithley Instruments
- Understanding Low-Voltage Measurements, www.rsleads.com/212ee-611
- Audio Analysis Testing Using a KPCI-3108 Board With LabWindows/CVI 5.0.1, www.rsleads.com/212ee-612
- Measuring Laser-Diode Optical Power With the Keithley Model 2500INT Integrating Sphere, www.rsleads.com/212ee-613
Krytar
- Directional Couplers: Term Definition, Testing, and Typical Applications, www.rsleads.com/212ee-615
- Microwave or RF Amplifier Test Setup, www.rsleads.com/212ee-616
- External Leveling Loop for a Microwave Signal Generator, www.rsleads.com/212ee-617
- Inexpensive Scalar Measurement of a Bandpass Filter or Other Passive Device or Component, www.rsleads.com/212ee-618
Laplace Instruments
- Background Cancellation…Does It Work??, 01144-1263-515160
- Calibration of Compact Test Cells, www.rsleads.com/212ee-625
LeCroy
- Separating Jitter Sources, www.rsleads.com/212ee-626
- Parameter Mathematics, www.rsleads.com/212ee-627
- Custom Measurements, www.rsleads.com/212ee-628
- Custom Math With VBScript, www.rsleads.com/212ee-629
- Log Horizontal With VBScript, www.rsleads.com/212ee-630
- PLL Loop Bandwidth, www.rsleads.com/212ee-631
- X-Stream Technology Adds Turbocharger to Oscilloscopes, www.rsleads.com/212ee-632
- WaveShape Analysis, www.rsleads.com/212ee-633
- Setting Up an FFT in Wavemaster, www.rsleads.com/212ee-634
- Filter Signals Using MATLAB, www.rsleads.com/212ee-635
- Virtual Memories in WaveMaster, www.rsleads.com/212ee-636
- Splitting the Grid, www.rsleads.com/212ee-637
- CDMA, www.rsleads.com/212ee-638
National Instruments
- How to Measure Small Signals Buried in Noise Using LabVIEW and Lock-In Amplifier Techniques, www.rsleads.com/212ee-724
- Virtual Instrumentation, www.rsleads.com/212ee-726
OPHIRRF
- Minimizing In-Band Harmonics at Higher Frequencies, www.rsleads.com/212ee-679
QuadTech
- Electrical Safety Testing Reference Guide (4th Edition), www.rsleads.com/212ee-680
- LCR Measurement Primer (2nd Edition), www.rsleads.com/212ee-681
RF Engines
- PFT-Technical Overview of the PFT Architecture and Comparisons Against FFT and Digital Frequency Converter Techniques (PDF 371k), www.rsleads.com/212ee-684
- Pipelined FFT Core, www.rsleads.com/212ee-685
- White Paper-Comparison of the Transient Response of Different Filter Bank Types, www.rsleads.com/212ee-686
TDA Systems
- · Measurement of Input and Output Die Capacitance for M-LVDS and Other Signaling Standards Using TDR, www.rsleads.com/212ee-698
- Signal Integrity Modeling of Gigabit Backplanes, Cables, and Connectors Using TDR, www.rsleads.com/212ee-699
- TDR Primer, www.rsleads.com/212ee-700
- Choosing Signal Integrity Measurement Tools: Time or Frequency Domain? www.rsleads.com/212ee-701
- Signal Trace and Power Plane Shorts Fault Isolation Using TDR, www.rsleads.com/212ee-702
- Practical Characterization of Lossy Transmission Lines Using TDR, www.rsleads.com/212ee-703
- Improved Method for Characterizing and Modeling Flex-Circuit-Based Connectors at 2.5 Gb/s, www.rsleads.com/212ee-704
- TDR Techniques for Characterization and Modeling of Electronic Packaging, www.rsleads.com/212ee-705
Tektronix
- PowerPC Debug: Integrated Solutions for Hardware and Software Challenges, www.rsleads.com/212ee-711
- Signal Integrity Digital Design Primer, www.rsleads.com/212ee-712
- Using Real-Time Oscilloscopes to Make Power Electronics Measurements, www.rsleads.com/212ee-713
Communications Test
Acterna
- SONET testing With the FST-2310 and FST-2510a, www.rsleads.com/212ee-400
Agilent Technologies
- Troubleshooting Voice Delay on IP Telephony Networks, www.rsleads.com/212ee-405
- Performing Pre-VoIP Network Assessments, www.rsleads.com/212ee-406
- Using Abis Data to Improve GSM QoS, www.rsleads.com/212ee-407
- Testing Voice Quality on Next-Generation Networks Using the Agilent VQT, www.rsleads.com/212ee-408
- Agilent Technologies FrameScope 350 Network Performance Metrics, www.rsleads.com/212ee-409
- Easing the Way to Installing the Next-Generation Optical Transmission Platforms (SONET), www.rsleads.com/212ee-410
- Agilent on Troubleshooting H.323 Signaling, www.rsleads.com/212ee-411
- Agilent Advisor SIP, www.rsleads.com/212ee-412
- Voice Quality Converging Telephony and IP Networks, www.rsleads.com/212ee-413
- Methods of Measuring Perceptual Speech Quality, www.rsleads.com/212ee-414
- Unlocking Business Opportunities in the Metro Market, www.rsleads.com/212ee-415
- Forward Link Measurements for 1xEV-DO Access Networks (AN 1398), 970-679-2028
- An Introduction to Multiport and Balanced Device Measurements (AN 1373-1), www.rsleads.com/212ee-438
- Concepts in Balanced Device Measurements (AN 1373-2), www.rsleads.com/212ee-439
- Novel Method for Vector Mixer Characterization Using New Vector Characterization Techniques, www.rsleads.com/212ee-440
- Comparison of Mixer Characterization Using New Vector Characterization Techniques, www.rsleads.com/212ee-441
Anritsu
- 36584 Series 4-Port AutoCal VNA and VNMS, www.rsleads.com/212ee-740
- 3658X Series 2-Port AutoCal VNA and VNMS, 800-267-4878
- 4-Port AutoCal, www.rsleads.com/212ee-742
- Arbitrary Impedance, www.rsleads.com/212ee-743
- Embedding/De-Embedding, www.rsleads.com/212ee-744
- MN9320A Application Note, www.rsleads.com/212ee-747
- MD1230A Application Note (Anritsu MD9320A Optical Channel Drop Unit), 800-267-4878
Credence
- Modulated Vector Network Analysis (MVNA) Technology-Applying Real-World Signals for Wireless RFIC Test, 510-492-3159
dBm Optics
- PDL Measurement With OMU-925, 800-944-7885
- Operating the CSA With the New Focus 6428 TL8, 800-944-7885
- Using the dBm Trigger Box Accessory, 800-944-7885
- Transferring Large Data Sets, 800-944-7885
- Typical Test-Grade Optical Switch Performance Data, 800-944-7885
- Wavelength Testing Using Gas Cells, 800-944-7885
- SREAL File Converter, 800-944-7885
- PDL-Matrix Method Measurement, 800-944-7885
- FTP Connections to the CSA, 800-944-7885
- Minimizing FC/APC Connection Variation, 800-944-7885
- CSA Wavelength Performance Operating With the TLS-650 Tunable Laser, 800-944-7885
- Making Good Low Power Optical Measurements, 800-944-7885
- Using SCPIComm, 800-944-7885
- Measuring Low Values of Polarization Dependent Split Ratio (PDSR) in a Splitter, 800-944-7885
- Using the CSA Locator, 800-944-7885
- Measuring PDW, 800-944-7885
- Interferometric Dispersion Measurement, 800-944-7885
EXFO
- 2600B Series Tunable Laser Sources: Wavelength Uncertainty and User Calibration Procedures, www.rsleads.com/212ee-727
- Planar Lightguide Circuits: An Emerging Market for Refractive Index Profile Analysis, www.rsleads.com/212ee-728
- Bidirectional OTDR Testing: Multimode vs. Singlemode Fibers, www.rsleads.com/212ee-729
- Optical Return Loss Testing – Ensuring High-Quality Transmission, www.rsleads.com/212ee-730
- Chromatic Dispersion Analysis Methods, www.rsleads.com/212ee-731
- ORL Testing of 16-Channel Thin-Film Multiplexer/Demultiplexer, www.rsleads.com/212ee-732
- Determining the Central Wavelength of a Fiber Bragg Grating Profile, www.rsleads.com/212ee-733
- DOP Testing Methods for Pump Modules in Raman Application, www.rsleads.com/212ee-734
- PMD or Multipath Interference Dispersion Which Is of More Practical Importance? www.rsleads.com/212ee-735
- Gigabit Ethernet Testing-Increasing Service Provider Revenue, www.rsleads.com/212ee-736
- PMD: The Interferometric Method, www.rsleads.com/212ee-737
Giga-tronics
- CDMA High Power Base Station Testing, www.rsleads.com/212ee-542
- GSM Edge Measurements With the 8650A Universal Power Meter, www.rsleads.com/212ee-543
- CDMA Measurements Using the 8650A Universal Power Meter, www.rsleads.com/212ee-544
IFR, an Aeroflex Company
- Fractional-N Synthesizers, www.rsleads.com/212ee-557
- Reconfigurable Test Solution for Advanced Wireless Test, www.rsleads.com/212ee-558
- Intermodulation With the IFR 2309 100-MHz to 2.4-GHz FFT, www.rsleads.com/212ee-559
- Using 2310 With Option 01 to Make Wideband Noise Measurements on TETRA Transmitters, www.rsleads.com/212ee-560
- Using the External Data Interface on the 2050 Series Digital and Vector Signal Generators, www.rsleads.com/212ee-561
- Understanding Your Signal Generator Output Specification, www.rsleads.com/212ee-562
- Instrument Landing System (ILS) and Distance Measuring Equipment (DME) Ground Receiver and Monitor Alarm Testing, www.rsleads.com/212ee-563
- Instrument Landing System Receiver Testing, www.rsleads.com/212ee-564
- Bluetooth Test Capability on 2026B, www.rsleads.com/212ee-565
- GSM Testing Using the 2026 Family Signal Generators With Option 116, www.rsleads.com/212ee-566
- X.21 Monitoring for Fault Localization, www.rsleads.com/212ee-567
- Eurocom Data Interfaces in the 2850 Series, www.rsleads.com/212ee-568
- IFR 2968 Frequently Asked Questions, www.rsleads.com/212ee-569
- GPRS Mobile Phones-An Overview for Test Professionals, www.rsleads.com/212ee-571
- Maximizing GSM Mobile Repair Center Throughput, www.rsleads.com/212ee-572
- Testing the Radio Performance of TETRA Terminals and Base Stations, www.rsleads.com/212ee-573
- Testing GAIT Phase One Mobiles, www.rsleads.com/212ee-574
- Using the IFR COM-120B to Quickly Align Problem IF Stages, www.rsleads.com/212ee-575
- Testing TETRA Mobiles With the IFR 2968, www.rsleads.com/212ee-576
- GPRS Test Option With Demonstration Screen Shots, www.rsleads.com/212ee-577
- L-3 Communications Telemetry-West Impact White Paper, 858-694-7942
- TT&C System for NASDA Ground Network, 858-694-7942
- A Flexible Multifunction Telemetry Input/Output Module, 858-694-7942
- Managing Telemetry as an Enterprise Solution, 858-694-7942
- Vista-Telemetry System for the Enterprise, 858-694-7942
LeCroy
The MathWorks
- Bluetooth Voice Simulink Model, 508-647-7000
- Fast-Converging CMA-Based Blind Equalization Algorithm for QAM Modems, 508-647-7000
- SCORT-New Bluetooth Packet Type for 802.11b Interference Avoidance, 508-647-7000
SiQual
- Printed Circuit Design Challenges at 1 GB/s and Above, www.rsleads.com/212ee-693
Tektronix
- Identifying Failures and Quality Problems in GPRS Networks, 800-426-2200
- Characterizing Time and Frequency Interactions in Telecommunications Signals, www.rsleads.com/212ee-707
- Automatic Measurement Algorithms for Communications Applications, www.rsleads.com/212ee-708
- Eye Measurements on Optical Signals, www.rsleads.com/212ee-709
- Testing Video Transport Streams Using Templates, www.rsleads.com/212ee-710
Environmental Test
C. Hanse Industries
- A Beginner’s Guide to HALT, 269-673-8638
Data Physics
- Alarm Monitoring of Railway Signals Using SignalCalc ACE FFT Analyzer and ActiveX, www.rsleads.com/212ee-465
- Sine Data Reduction, www.rsleads.com/212ee-466
- Sound Sense, www.rsleads.com/212ee-467
- Understanding the Physics of Electrodynamic Shaker Performance, www.rsleads.com/212ee-468
- Scientific Christmas Shopping, www.rsleads.com/212ee-469
- The Difficulties in Evaluating A-Weighted Sound-Level Measurements, www.rsleads.com/212ee-470
- Analysis of Friction-Induced Vibration Leading to Eek Noise in a Dry Friction Clutch, www.rsleads.com/212ee-471
Environmental Stress Systems
- Environmental Testing-Expendable Refrigerants vs. Mechanical Refrigeration, www.rsleads.com/212ee-500
Equipment Reliability Institute
- Building Vibration Can Contaminate Cleanrooms, Products, and Processes, 805-564-1260
- Vibration and Shock Isolation Trends and Solutions, www.rsleads.com/212ee-502
- Response-Optimized Vibration Testing and Screening, 805-564-1260
- Designing PCBs to Withstand Harsh Environments, www.rsleads.com/212ee-504
- Much Automotive Vibration Testing Is Overly Severe, 805-564-1260
- What Can I Do to Reduce Warranty Costs? 805-564-1260
- Interviewing Vibration and Shock Technologists, 805-564-1260
- Mechanical Engineer’s Fourier Analyzer, 805-564-1260
- Road Inputs Contain All Frequencies Simultaneously, 805-564-1260
- So You’re Going to Witness a Vibration Test, 805-564-1260
- Buzz, Squeak, and Rattle (BSR) Shaking, 805-564-1260
- Fifth Edition: Harris’ Shock and Vibration Handbook Reviewed, 805-564-1260
- Remote Control of Vibration Test, 805-564-1260
- PSD in g2/Hz Explained, 805-564-1260
ESPEC
- Technical Report #11: Evaluating Reliability and Environmental Testing, www.rsleads.com/212ee-515
- Technical Report #12: Reliability Testing and Environmental Testing Standards, www.rsleads.com/212ee-516
- Technical Report #13: Reliability Testing and Burn-In Systems, www.rsleads.com/212ee-517
- ESPEC Educational Newsletter, www.rsleads.com/212ee-518
Loranger International
- Package Temperature Evaluations in Burn-In Sockets, www.rsleads.com/212ee-640
- New Socket Performance, www.rsleads.com/212ee-641
- Effects of Gold-Plated Contacts, www.rsleads.com/212ee-642
m+p International
- Closed-Loop Control for Sonic Fatigue Testing Systems, 973-239-3005
- Sine Dwell Testing of Turbine Blades, 973-239-3005
- A New Method for Designing MIL-STD Shock Tests, 973-239-3005
Micro Control Company
- Thermal Aspects of Burn-In of High-Power Semiconductor Devices, 763-786-8750
Screening Systems
- Part 1: Introduction to HALT and HASS, 949-855-1751
- Part 2: Introduction to HALT and HASS, 949-855-1751
- Stressing the Difference-Quasi-Random vs. Repetitive Shock Vibration, 949-855-1751
- Implementing the HASS Process, 949-855-1751
- Advanced Accelerated Testing Practices and Results, 949-855-1751
- Upscreening and Derating OEM Designs by HALT and HASS Testing, 949-855-1751
Thermotron Industries
- The Application of Burn-In to DC/DC Converter Production Testing, 616-393-4580
- Why Test Your Products During Stress Testing? 616-393-4580
Unholtz-Dickie
- High-Frequency Shock Test System, 203-265-3929
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Published by EE-Evaluation Engineering
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No reprint, distribution, or reuse in any medium is permitted
without the express written consent of the publisher.
December 2002
