Reader’s Resource

    Dec. 1, 2002

    You’re right if you think the Internet is filled with useful information. The problem is how to find the application notes, technical notes, or white papers that address your needs. That’s where EE-Evaluation Engineering can help.

    As a service to you, we asked leading companies in the electronics test industry to tell us what technical information they had prepared and published during the last two years. The listings that follow are representative of their responses.

    The information is categorized in seven major groups including ATE, Semiconductor and IC Test, PC-Based Test, Software, Instrumentation, Communications Test, and Environmental Test. Within each category, the information is organized by company name. And we’ve made it easy for you to go directly to the notes and white papers that are on the Internet by entering a www.rsleads.com/212ee-xxx URL. If the note or white paper is available only in printed form, the phone number of the company is listed so you can order the note or paper.

    Of course, there are exceptions. A few sites require you to register before accessing the technical information. However, for all the companies listed here, access after registration is immediate.

    Some companies list magazine sites as locations where you can download an article. This approach works initially, but as time goes by, older issues may not be available on the magazine’s site. Similarly, articles that appeared in technical journals or were presented at conferences often are not freely accessible on line. Phoning the company is the best way to find an article.

    Other than those small inconveniences, browse away. Generally, application notes describe how to use a specific product to solve a problem. Technical notes may discuss a product feature, or they can be more generic and theoretical. White papers are the most unbiased of all three categories and usually present a technical discussion related to a new product, process, or technology.

    On the other hand, don’t judge a book by its cover. Definitions vary widely among companies, so reading at least the introduction or abstract is the best way to decide if the topic is for you. We limited the number of entries from each company, but many web sites have hundreds of well-researched and timely technical papers. Happy surfing!

    ATE

    Advantest America

    • New High-Speed, High-Density MEMS-Based Probe Technology, 847-821-3204
    • Advanprobe Technology, 847-821-3204
    • Advantest’s PhotoFinger™ Probecard, 847-821-3204
    • High-Density Photolithographic Advanprobe Technology,  847-821-3204

    Agilent Technologies

    CableTest Systems

    Credence

    • Optimized Engineering Validation Test Systems Improve Time-to Market, Cost, and Quality of Complex Systems, 510-492-3159
    • Reducing Risks in Outsource Services, 510-492-3159
    • Managing RFIC Test Challenges for 3G Services, 510-492-3159

    Digalog Systems

    Dynalab

    • Fixture Clamp Activation, 614-866-9999
    • How to Prevent Removal of Harness From Fixture Before Testing Is Completed, 614-866-9999
    • Random Continuity Testing, 614-866-9999

    Keithley Instruments

    Mentor Graphics

    National Instruments

    SPEA spa

    • 4040: The Flying Probe That Has No Obstacles, 01139 011 9825400
    • Access the Inaccessible? Possible With Flying Probe Tester, 01139 011 9825400
    • Flying Probe Test System: SPEA Launches the 3rd Generation, 01139 011 9825400
    • Innovative Test Solution for LCD Drivers, 01139 011 9825400

    VXI Technology

    Semiconductor Test/IC Test

    Innoventions

    Mentor Graphics

    PC-Based Test

    Advantest America

    • New High-Speed, High-Density MEMS-Based Probe Technology, 847-821-3204
    • Advanprobe Technology, 847-821-3204
    • Advantest’s PhotoFinger™ Probecard, 847-821-3204
    • High-Density Photolithographic Advanprobe Technology, 847-821-3204

    Cami Research

    Computer Aided Solutions

    Gage Applied

    Geotest-Marvin Test Systems

    GOEPEL Electronic

    Interactive Circuits and Systems

    JTAG Technologies

    • Hierarchical Boundary Scan-A Scan Chip-Set Solution, 425-898-8968
    • Boundary-Scan Tool Supports Massively Parallel Programming, 425-898-8968
    • In-System PLD Programming Using Boundary-Scan (JTAG), www.rsleads.com/212ee-600
    • JTAG Visualizer Makes Boundary Scan Visible, 425-898-8968
    • IEEE-1149.x Standards: Achievements vs. Expectations, 425-898-8968
    • Boundary Scan, a Low-Cost, High-Performance Alternative for Testing Limited-Access PCBs, 425-898-8968
    • Boundary Scan’s Next Plateau: Testing and In-System Configuration at the System Level, 425-898-8968
    • Boundary Scan Controllers Summary, 425-898-8968
    • Visualizing Boundary Scan, 425-898-8968
    • Bridges Enhance System Boundary Scan, 425-898-8968
    • JTAG Test, 425-898-8968
    • Why Use “JTAG” for Testing and In-System Programming, an Executive Summary of Recent Advances in Test Technology, 425-898-8968
    • Integrated Test Technologies to Improve Yields and Reduce Cost to Test, 952-920-7682

    Microstar Laboratories

    National Instruments

    Quatech

    Software

    GOEPEL Electronic

    ICS Electronics

    JTAG Technologies

    • Hierarchical Boundary Scan-A Scan Chip-Set Solution, 425-898-8968
    • Boundary Scan Tool Supports Massively Parallel Programming, 425-898-8968
    • JTAG Programming of PLDs and Flash Memories “In System”, www.rsleads.com/212ee-600
    • JTAG Visualizer Makes Boundary Scan Visible, 425-898-8968
    • IEEE-1149.x Standards: Achievements vs. Expectations, 425-898-8968
    • Boundary Scan, a Low-Cost, High-Performance Alternative for Testing Limited-Access PCBs, 425-898-8968
    • Boundary Scan’s Next Plateau: Testing and In-System Configuration at the System Level, 425-898-8968
    • Boundary Scan Controllers Summary, 425-898-8968
    • Visualizing Boundary Scan, 425-898-8968
    • Bridges Enhance System Boundary Scan, 425-898-8968
    • JTAG Test, 425-898-8968
    • Why Use “JTAG” for Testing and In-System Programming, an Executive Summary of Recent Advances in Test Technology, 425-898-8968
    • Integrated Test Technologies to Improve Yields and Reduce Cost to Test, 952-920-7682
    • Design for Test Guidelines for Board Testing and In-System Configuration, 877-367-5824
    • Design for Test Guidelines for System-Level Testing and In-System Configuration, 877-367-5824

    The MathWorks

    • System-Level Design for Programmable and Reconfigurable DSP Architectures, 508-647-7000
    • Bluetooth Voice Simulink Model, 508-647-7000
    • Fast-Converging CMA-Based Blind Equalization Algorithm for QAM Modems, 508-647-7000
    • SCORT-New Bluetooth Packet Type for 802.11b Interference Avoidance, 508-647-7000
    • Modeling DC Power Distribution in an Automatic Train Control, 508-647-7000
    • Analyze, Model, Validate, Deploy: A Better Approach to Model-Based Design, 508-647-7000

    Mentor Graphics

    National Instruments

    Instrumentation

    Anritsu

    Associated Research

    Bustronic

    California Instruments

    Data Device

    Datum

    Dewetron

    Fluke

    IFR, an Aeroflex Company

    Keithley Instruments

    Krytar

    Laplace Instruments

    LeCroy

    National Instruments

    OPHIRRF

    QuadTech

    RF Engines

    TDA Systems

    Tektronix

    Communications Test

    Acterna

    Agilent Technologies

    Anritsu

    Credence

    • Modulated Vector Network Analysis (MVNA) Technology-Applying Real-World Signals for Wireless RFIC Test, 510-492-3159

    dBm Optics

    • PDL Measurement With OMU-925, 800-944-7885
    • Operating the CSA With the New Focus 6428 TL8, 800-944-7885
    • Using the dBm Trigger Box Accessory, 800-944-7885
    • Transferring Large Data Sets, 800-944-7885
    • Typical Test-Grade Optical Switch Performance Data, 800-944-7885
    • Wavelength Testing Using Gas Cells, 800-944-7885
    • SREAL File Converter, 800-944-7885
    • PDL-Matrix Method Measurement, 800-944-7885
    • FTP Connections to the CSA, 800-944-7885
    • Minimizing FC/APC Connection Variation, 800-944-7885
    • CSA Wavelength Performance Operating With the TLS-650 Tunable Laser, 800-944-7885
    • Making Good Low Power Optical Measurements, 800-944-7885
    • Using SCPIComm, 800-944-7885
    • Measuring Low Values of Polarization Dependent Split Ratio (PDSR) in a Splitter, 800-944-7885
    • Using the CSA Locator, 800-944-7885
    • Measuring PDW, 800-944-7885
    • Interferometric Dispersion Measurement, 800-944-7885

    EXFO

    Giga-tronics

    IFR, an Aeroflex Company

    LeCroy

    The MathWorks

    • Bluetooth Voice Simulink Model, 508-647-7000
    • Fast-Converging CMA-Based Blind Equalization Algorithm for QAM Modems, 508-647-7000
    • SCORT-New Bluetooth Packet Type for 802.11b Interference Avoidance, 508-647-7000

    SiQual

    Tektronix

    Environmental Test

    C. Hanse Industries

    • A Beginner’s Guide to HALT, 269-673-8638

    Data Physics

    Environmental Stress Systems

    Equipment Reliability Institute

    • Building Vibration Can Contaminate Cleanrooms, Products, and Processes, 805-564-1260
    • Vibration and Shock Isolation Trends and Solutions, www.rsleads.com/212ee-502
    • Response-Optimized Vibration Testing and Screening, 805-564-1260
    • Designing PCBs to Withstand Harsh Environments, www.rsleads.com/212ee-504
    • Much Automotive Vibration Testing Is Overly Severe, 805-564-1260
    • What Can I Do to Reduce Warranty Costs? 805-564-1260
    • Interviewing Vibration and Shock Technologists, 805-564-1260
    • Mechanical Engineer’s Fourier Analyzer, 805-564-1260
    • Road Inputs Contain All Frequencies Simultaneously, 805-564-1260
    • So You’re Going to Witness a Vibration Test, 805-564-1260
    • Buzz, Squeak, and Rattle (BSR) Shaking, 805-564-1260
    • Fifth Edition: Harris’ Shock and Vibration Handbook Reviewed, 805-564-1260
    • Remote Control of Vibration Test, 805-564-1260
    • PSD in g2/Hz Explained, 805-564-1260

    ESPEC

    Loranger International

    m+p International

    • Closed-Loop Control for Sonic Fatigue Testing Systems, 973-239-3005
    • Sine Dwell Testing of Turbine Blades, 973-239-3005
    • A New Method for Designing MIL-STD Shock Tests, 973-239-3005

    Micro Control Company

    • Thermal Aspects of Burn-In of High-Power Semiconductor Devices, 763-786-8750

    Screening Systems

    • Part 1: Introduction to HALT and HASS, 949-855-1751
    • Part 2: Introduction to HALT and HASS, 949-855-1751
    • Stressing the Difference-Quasi-Random vs. Repetitive Shock Vibration, 949-855-1751
    • Implementing the HASS Process, 949-855-1751
    • Advanced Accelerated Testing Practices and Results, 949-855-1751
    • Upscreening and Derating OEM Designs by HALT and HASS Testing, 949-855-1751

    Thermotron Industries

    • The Application of Burn-In to DC/DC Converter Production Testing, 616-393-4580
    • Why Test Your Products During Stress Testing? 616-393-4580

    Unholtz-Dickie

    • High-Frequency Shock Test System, 203-265-3929

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    Published by EE-Evaluation Engineering
    All contents © 2002 Nelson Publishing Inc.
    No reprint, distribution, or reuse in any medium is permitted
    without the express written consent of the publisher.

    December 2002

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