In the Sept. 2, 2003 issue of Search EngineWatch.com, Danny Sullivan tracked the different stages of search-engine development. Not surprising, search-engines have become capable of accessing billions of textual documents.
Fortunately, search engines are continuously improving, driven by the increasing quantity of information on the Web. But as the Web grows, the chance diminishes that a search engine will find precisely the document you require. That’s why EE-Evaluation Engineering has done the searching for you.
In the 2003 “Reader’s Resource,” we’ve categorized and listed hundreds of technical documents that were published within the last two years. These are new sources of information that were not included in our 2002 “Reader’s Resource.”
To access the information, first select the relevant topic: ATE, Semiconductor Test/IC Test, PC-Based Test, Software, EMC, Environmental Test, Instrumentation, Communications Test, Measurement/Analysis, or Miscellaneous. Companies are listed alphabetically in each section, and the document titles appear below each company.
Reaching the actual Web page is made easy by the exclusive EE-Evaluation Engineering rsleads URL system. Simply enter www.rsleads.com/312ee- followed by the number corresponding to the desired listing. In most cases, a single click will take you directly to the document. For those websites that require registration prior to allowing document access, you will be taken to the registration page.
Although more than 90% of the documents listed are available on the Web, a few are not. Generally, these are article reprints available by contacting the company using the phone number or e-mail address provided.
Happy browsing!
| ATE | Environmental Stress Screening |
| Semiconductor Test / IC Test | Instrumentation |
| PC-Based Test | Communications Test |
| Software | Measurement / Analysis |
| EMC Test | Miscellaneous |
Agilent Technologies
- Reducing Noise in Switching for Test Systems www.rsleads.com/312ee-400
- Test System Signal Switching (AN 1441-1)
www.rsleads.com/312ee-401 - Test-System Development Guide: Introduction to Test-System Design
www.rsleads.com/312ee-402 - Bluetooth™ Manufacturing Test: A Guide to Getting Started (AN 1333-4)
www.rsleads.com/312ee-403
Amrel
- Powering the Next ATE
www.rsleads.com/312ee-404
C&H Technologies
- Use of Intelligent Mezzanine Carriers for Legacy Instrument Replacement in VXI Systems
www.rsleads.com/312ee-405
Cable Test Systems
- In-Process and Final Testing of Electrical Wiring Harnesses for Recreational Boat Manufacturers
www.rsleads.com/312ee-406 - Mass Hi-Pot Testing
www.rsleads.com/312ee-407 - Primer on Cable Testing Techniques
www.rsleads.com/312ee-408
GOEPEL electronic
- Boundary Scan Tutorial
www.rsleads.com/312ee-410 - Solder Joint Inspection at J-Lead Pins
www.rsleads.com/312ee-411 - Application of AOI Systems in Backplane Manufacturing
www.rsleads.com/312ee-412 - Solder Joint Inspection in High-Mix/Low-Volume—Advancing With Fewer Cameras
www.rsleads.com/312ee-413 - Operator Convenience—a Key Factor for AOI Systems
www.rsleads.com/312ee-414
Keithley Instruments
- Maximizing DMM Productivity in Wireless Device Quality Testing
www.rsleads.com/312ee-416
Mentor Graphics
- Co-Verification: From Tool to Methodology
www.rsleads.com/312ee-417 - Is Silicon “Free”?
www.rsleads.com/312ee-418 - The Right Verification Strategy for You
www.rsleads.com/312ee-420 - Embedded Deterministic Test—DFT Technology for High-Quality Low-Cost IC Manufacturing Test
www.rsleads.com/312ee-421
National Instruments
- Benefits of Parallel Testing
www.rsleads.com/312ee-422 - PXI: The Industry Standard for Manufacturing Test
www.rsleads.com/312ee-423
Pentek
- Thermal Management Techniques for VME Systems
www.rsleads.com/312ee-424
Teradyne
- Challenges of Testing Low-Voltage Technologies at In-Circuit Test
www.rsleads.com/312ee-425 - Gigabit Ethernet Test Challenges on the Manufacturing Floor
www.rsleads.com/312ee-426
Teseda
- The DFT-Focused Tester
www.rsleads.com/312ee-427
Cascade Microtech
- RF Probe Selection Guide
www.rsleads.com/312ee-428 - On-Wafer Probing With the Keithley 4200-SCS
www.rsleads.com/312ee-429 - Increased Calibration Accuracy, Repeatability and Engineering Productivity for Multiport On-Wafer Wafer Measurements
www.rsleads.com/312ee-430 - Air Coplanar Angle Series Probes
www.rsleads.com/312ee-431 - High-Frequency Performance With Low, Stable Contact Resistance on Aluminum Pads
www.rsleads.com/312ee-432 - ISS Series of Impedance Standard Substrates
www.rsleads.com/312ee-433 - Advanced Solutions for On-Wafer MOS CV
www.rsleads.com/312ee-434 - An Overview of Cascade Microtech’s RF Probing Solutions
www.rsleads.com/312ee-435 - Multiport/Differential Characterization
www.rsleads.com/312ee-436 - Wafer Probing Solutions for Process Qualification – WLR
www.rsleads.com/312ee-437 - MicroProbe Update, Vol. 37, Fall 2002
www.rsleads.com/312ee-438 - MicroProbe Update, Vol. 38, Winter 2002
www.rsleads.com/312ee-439 - MicroProbe Update, Vol. 39, Summer 2003
www.rsleads.com/312ee-440 - Advanced High-Frequency On-Wafer Capacitance Measurement Solution
www.rsleads.com/312ee-441 - Differential/Signal Integrity Characterization
www.rsleads.com/312ee-442 - What If Your Measurement Application Software Were Wavevue Measurement Studio?
www.rsleads.com/312ee-443 - On-Wafer Process Qualification – WLR System
www.rsleads.com/312ee-444
CST
- Innovative Testing Rescues Fallout DRAMS
www.rsleads.com/312ee-445 - Understanding DDR Presence Detect (SPD) Table
www.rsleads.com/312ee-446 - DDR Registered Modules
www.rsleads.com/312ee-447 - Significance of JEDEC DIMM Module
www.rsleads.com/312ee-448 - DRAM Memory Trends
www.rsleads.com/312ee-449 - 101 About Memory Chip Testing
www.rsleads.com/312ee-450 - Is DDR400 Real?
www.rsleads.com/312ee-451 - Then and Now in Memory
www.rsleads.com/312ee-452 - An Unofficial Guide to DDR400 or PC3200 DDR SDRAM
www.rsleads.com/312ee-453 - DDR333: Migration to the Mainstream
www.rsleads.com/312ee-454
Data I/O
- Creating Competitive Advantage With a Connected Programming Strategy
www.rsleads.com/312ee-455 - Thanks to AMD® and Data I/O®, You Don’t Have to Compromise When Using High-Density Flash Memory
www.rsleads.com/312ee-456
ICT
- Probing of Flip Chip (C4) Devices
203-264-5757
Keithley Instruments
- DC Production Testing of OLED Displays
www.rsleads.com/312ee-458 - Improving Low-Current Measurements on Nanoelectronic and Molecular Electronic Devices
www.rsleads.com/312ee-459 - New Test Realities for Evolving FPD Technologies
www.rsleads.com/312ee-460 - Probe Card Tutorial
www.rsleads.com/312ee-461 - Product Testing Where RF Meets Broadband—Convergence of RF, Optical, and Digital Test Environments
www.rsleads.com/312ee-462 - Instrumenting DWDM Laser Diode Production Tests
www.rsleads.com/312ee-463 - Laser Diode Module Testing Critical to Development of High Bandwidth Communications Systems
www.rsleads.com/312ee-464 - Production Testing of High-Intensity, Visible LEDs
www.rsleads.com/312ee-465 - Pulse Testing of Laser Diodes
www.rsleads.com/312ee-466 - Who Really Needs RF Process Monitoring?
www.rsleads.com/312ee-467
Kulicke & Soffa
- Effect of High-Temperature Heating on Music Wire Spring Performance
www.rsleads.com/312ee-468 - Characterization of a Thermal Control Unit Using Various Thermal Enhancers
www.rsleads.com/312ee-469 - Overcoming the Key Barriers in 35-µm Pitch Wire Bonding Packaging: Probe, Mold, and Substrate Solutions and Trade-Offs
www.rsleads.com/312ee-470 - Effects of the Liquid Inlet Temperature on the Thermoelectric Cooler Performance in a Liquid-TEC Thermal System
www.rsleads.com/312ee-471
LeCroy
- LAB WM440 Safe Operating Area
www.rsleads.com/312ee-472 - LAB 438 Power Device Analysis
www.rsleads.com/312ee-473
The Micromanipulator Co.
- Measurements for Analog and Digital Circuits
800-967-4358
Acqiris USA
- The Status of the STACEE Observatory
www.rsleads.com/312ee-474
Computer Aided Solutions
- Using Adwin as a Multi-Channel Trigger Controller
www.rsleads.com/312ee-475 - Adwin Systems for Test Automation in Development and Production
www.rsleads.com/312ee-476
Data Translation
- Data Acquisition Helps Veterinarians Assess Animal Gait Problems
www.rsleads.com/312ee-477 - Real-Time DSP Data Acquisition for High-Speed Host Transfer
www.rsleads.com/312ee-478 - Subject-Oriented Software Development System for DSP
www.rsleads.com/312ee-479 - Designing a Machine Vision System
www.rsleads.com/312ee-480 - Why Your Next PCI Frame Does Not Need On-Board Memory
www.rsleads.com/312ee-481
Interactive Circuits and Systems
- Building a Versatile Low Latency Cognitive Radio for Multimission Applications With the ICS-572
www.rsleads.com/312ee-730 - Acquisition and FPGA-Based Processing of Wideband Radio Signals in one PCI-Slot
www.rsleads.com/312ee-731 - Performance of 14-Bit Data Converters for SDR Applications
www.rsleads.com/312ee-732
Keithley Instruments
- Simulation & Test System for Electronic Control Units
www.rsleads.com/312ee-482 - Instrument-Grade DAQ Via Ethernet
www.rsleads.com/312ee-483 - Instrument-Grade Data Acquisition With Ethernet Brings Precision Measurement and Control to Networks
www.rsleads.com/312ee-484 - Making AST/Burn-In Testing More Productive With Ethernet-Based Instruments
www.rsleads.com/312ee-485 - Data Acquisition Card or DMM: Which Is Right for Your Application?
www.rsleads.com/312ee-486 - Internet-Enabled Data Acquisition Using VB6-Part I
www.rsleads.com/312ee-487 - Internet-Enabled Data Acquisition Using VB6-Part II
www.rsleads.com/312ee-488
LeCroy
- PXI: The Industry Standard Platform for Manufacturing Test
www.rsleads.com/312ee-489
Microstar Laboratories
- SLControl: PC-Based Data Acquisition and Analysis for Muscle Mechanics
www.rsleads.com/312ee-490
National Instruments
- Measuring Strain With Strain Gauges
www.rsleads.com/312ee-495 - Measuring Temperature With an RTD or Thermistor
www.rsleads.com/312ee-496 - Measuring Position and Displacement With LVDTs
www.rsleads.com/312ee-497 - Make Your Measurements Mobile
www.rsleads.com/312ee-498 - LabVIEW FPGA in Hardware-in-Loop Simulation Applications
www.rsleads.com/312ee-499
Agilent Technologies
- IntuiLinks Information
www.rsleads.com/312ee-500 - IVI-COM Information
www.rsleads.com/312ee-501 - T&M Toolkit, VEE, Visual Basic, and .NET Information
www.rsleads.com/312ee-502 - Using Advanced Design System to Design an MMIC Amplifier (AN 1462)
www.rsleads.com/312ee-503
Aptix
- Prototype Studio: RTL to PSP, Pre-Silicon Prototypes for System-on-Chip Designs
www.rsleads.com/312ee-504 - Block Based Prototyping
www.rsleads.com/312ee-505
automationtechies.com
- Introduction to the Transmission Control Protocol
www.rsleads.com/312ee-507 - Introduction to the Internet Protocol
www.rsleads.com/312ee-508
Hitex Development Tools
- •CTE-White Paper: From Problem Definition to Test Case Specification Using the Classification Tree Method and the Classification Tree Editor
www.rsleads.com/312ee-509
Interactive Circuits and Systems
- Smart Antenna Processing for Cellular Basestations Using the DaqPC
www.rsleads.com/312ee-733 - Arbitrary Generation of Radio Waveforms
www.rsleads.com/312ee-734 - A Multi-Channel, Multi-Band SDR VHF Receiver
www.rsleads.com/312ee-735 - Software Radar
www.rsleads.com/312ee-736
Keithley Instruments
- Using DriverLINX® Drivers With Lab Windows/CVI™
www.rsleads.com/312ee-510 - Using MATLAB® With Keithly KPCI Boards
www.rsleads.com/312ee-511
National Instruments
- Building a Web Service Application in LabVIEW 7.0
www.rsleads.com/312ee-512 - LabVIEW for Measurement and Data Analysis
www.rsleads.com/312ee-513 - Changing the Face of Design Patterns With LabVIEW 7 Express Event Structure
www.rsleads.com/312ee-514 - NI-DAQ7–The Next Phase in the Evolution of Data Acquisition Software
www.rsleads.com/312ee-515 - NI TestStand 3.0-Developing Automated Test Systems Faster and Smarter
www.rsleads.com/312ee-516 - Running MATRIXx SystemBuild Models in LabVIEW/LabVIEW Real-Time
www.rsleads.com/312ee-517
OpenNet Instruments
- XML Basics
www.rsleads.com/312ee-519
Pentek
- •DSP Application Development: C6000 vs. PowerPC
www.rsleads.com/312ee-520
Qualtech Systems
- Model-Based Prognostic Techniques
www.rsleads.com/312ee-521 - An Intelligent Remote Monitoring Solution for the International Space Station
www.rsleads.com/312ee-522 - Data Mining of Aviation Data for Advancing Health Management
www.rsleads.com/312ee-523 - A Statistical Approach to Prognostics
860-257-8014 X107 - Enhanced Turbine Engine Diagnostic System (ETEDS)
860-257-8014 X107 - Remote Diagnostics Server Architecture
860-257-8014 X107 - Fault Detection Algorithms for Real-Time Diagnosis in Large Systems
860-257-8014 X107
Spectrum Signal Processing
- Multi-Channel SDR Architectures for C4ISR Applications
www.rsleads.com/312ee-524 - Heterogeneous Processing Meets System Level Needs
www.rsleads.com/312ee-525 - Software Radios Make Their Move
www.rsleads.com/312ee-526 - Adaptive Beam Forming Techniques in Software
www.rsleads.com/312ee-527 - Using Adaptive Beam Forming in Real-Life Tactical Situations
www.rsleads.com/312ee-528 - The Maturing Movement Towards Heterogenous Processing
www.rsleads.com/312ee-529 - Implementation of an OFDM Transceiver Using an SDR Platform
www.rsleads.com/312ee-530 - A High-Performance SDR Implementation for CompactPCI
www.rsleads.com/312ee-531 - A Reconfigurable Software Digital Radio Architecture for Electronic Signal Interception, Identification, Communication, and Jamming
www.rsleads.com/312ee-532 - Sorting Through the Comms Infrastructure Choices for Software Defined Radio
www.rsleads.com/312ee-533 - Software Communications Architecture: Who Has the Responsibility for Implementation?
www.rsleads.com/312ee-534 - Software Defined Radio Solutions for C4ISR Applications
www.rsleads.com/312ee-535 - Multi-Channel Direction Finding Systems
www.rsleads.com/312ee-536 - Fixed Broadband Wireless Access Networks
www.rsleads.com/312ee-537
Amplifier Research
- Update on IEC 61000-4-4 (EFT) Standard Changes
www.rsleads.com/312ee-538 - RF Conducted Immunity and Bulk Current Injection Testing Article
www.rsleads.com/312ee-539
Cadence Design Systems
- Modern High-Speed Design Methodology Integrating EMC and Signal Integrity
www.rsleads.com/312ee-540
Schaffner EMC
- Line Reactors in Power Electronics
www.rsleads.com/312ee-541
Tyco Electronics/Raychem Circuit Protection
- PPTC Design Considerations for Automotive Circuits
www.rsleads.com/312ee-542 - Eliminating Arcing in 42-V Automotive Electrical Connections
www.rsleads.com/312ee-543 - Using Protected Power Switches and PolySwitch Devices in USB
www.rsleads.com/312ee-544 - Solenoid Protection
www.rsleads.com/312ee-545
Equipment Reliability Institute
- Response-Optimized Vibration Testing and Screening
www.rsleads.com/312ee-546 - Buzz, Squeak, and Rattle (BSR) Shaking
[email protected] - Fifth Edition—Harris’ Shock and Vibration Handbook Reviewed
[email protected] - Remote Control of Vibration Test
[email protected] - PSD in g2/Hz Explained
[email protected] - Vibration Screening Custom Tailored for Electronics
[email protected] - Vibration and Shock Testing
[email protected] - Real Education
[email protected] - Vibration Analysis: A New NDT Tool
[email protected] - Accelerated Test—In-House or Outside?
[email protected] - Where Can I Get Information About Test Engineering?
[email protected] - Illuminating Dark Areas of Testing Technology Through Training
[email protected] - Fundamentals of Shock Testing Tutorial
[email protected]
LDS-Dactron
- Programmable Real-Time Filtering
www.rsleads.com/312ee-547 - Alias Protection
www.rsleads.com/312ee-548
Loranger
- Controlling Junction Temperature in QFNs
www.rsleads.com/312ee-553 - Burn-In Board Design Guidelines
www.rsleads.com/312ee-554 - Witness Marking & Solder Transfer During Burn-In at 125°C & 150°C
www.rsleads.com/312ee-555
METRAVIB RDS
- Efficient Computation of Engine Noise Radiation Characteristics
[email protected] - 3-D Inside Vehicle Acoustical Holography
[email protected] - Use of Acoustical Holography in 3-D Interior Measurements
[email protected] - Technical Issues of Nearfield Measurements Inside a Car for Improving Acoustic Comfort
[email protected] - Use of Acoustical Holography for Efficient 3-D Measurements Inside Car Interiors
[email protected] - A New Generation of Acoustic Imaging Techniques for 3-D Source Identification: Application to Engine Noise Reduction
[email protected] - Meeting Noise Regulations With Nearfield Acoustic Holography
[email protected] - Hybrid Acoustic Liner: A New Concept for Noise Reduction Flow Duct
[email protected] - Acoustic Splitter Based on Hollow Spheres Materials for Aircraft Engine Application
[email protected] - A Study of Radial Vibration of a Rolling Tire for Tire-Road Noise Characterization
[email protected] - Engine Noise Radiation Computations Based on an Efficient BE Method in Time Domain
[email protected] - Development of a Multi-Sensors Head Gasket for Knock Localization
[email protected] - New Knock Localization Methodology for SI Engines
[email protected]
Micro Control Co.
- Thermal Aspects of Burn-In for High-Power Semiconductor Devices
763-786-8750 - Low-Voltage/High-Power Noise Considerations
763-786-8750
QuadTech
- Electrical Safety Testing Reference Guide (4th Edition)
www.rsleads.com/312ee-557 - The IEC Collection
www.rsleads.com/312ee-558 - The Electrical Safety Testing (EST) Collection
www.rsleads.com/312ee-559
Slaughter
- Dielectric Withstand Testing of Modular and Manufactured Homes
www.rsleads.com/312ee-560
Aeroflex
- Accurate Power Measurements Using Spectrum Analyzers
www.rsleads.com/312ee-562 - Synthetic Test Systems: The Future of Test–Available Today
www.rsleads.com/312ee-563 - Introduction to FFT Analysis
www.rsleads.com/312ee-565
Agilent Technologies
- Signal Integrity Solutions: Find Problems Now, Prevent Problems Next Time
www.rsleads.com/312ee-567 - Restoring Confidence in Your High Bandwidth Probe Measurements (AN 1419-1)
www.rsleads.com/312ee-568 - Understanding Usability vs. Performance on High-Bandwidth Active Oscilloscope Probes (AN 1419-2)
www.rsleads.com/312ee-569 - Performance Comparison of Differential and Single Ended Active Voltage Probes (AN 1419-3)
www.rsleads.com/312ee-570 - Understanding Oscilloscope Frequency Response and Its Effect on Rise-Time Accuracy (AN 1420)
www.rsleads.com/312ee-571 - Finding Sources of Jitter With Real-Time Jitter Analysis (AN 1448-2)
www.rsleads.com/312ee-572 - Capturing Infrequent and Random Events Using Deep Memory Oscilloscopes (AN 1431)
www.rsleads.com/312ee-573 - Logic Analyzer Probing Techniques for High-Speed Digital Systems
www.rsleads.com/312ee-574 - Saving Time With Multiple-Channel Signal Integrity Measurements
www.rsleads.com/312ee-575 - Instrument I/O Information
www.rsleads.com/312ee-576
Amplifier Research
- Pulse TWTAs
www.rsleads.com/312ee-577
Associated Research
- SmartGFI® vs. Conventional GFI
www.rsleads.com/312ee-578 - Enhanced User Interface
www.rsleads.com/312ee-579 - An Explanation of Fail Verification
www.rsleads.com/312ee-580 - The Importance of Safety Agency Listing
www.rsleads.com/312ee-581 - The Use of an Isolation Transformer While Performing Line Leakage or Functional Run Tests
www.rsleads.com/312ee-582 - Dielectric Withstand Testing in a Production Environment
www.rsleads.com/312ee-583
Celerity Systems
- The CS2010VSG Vector Signal Generator
www.rsleads.com/312ee-585 - Notes on the Operation of the CS2040PNG
www.rsleads.com/312ee-586 - “If You Build It, You Have to Test It…”
www.rsleads.com/312ee-587
GuideTech
- GT658 as a Tool for Studying Single Molecule Dynamics
www.rsleads.com/312ee-588
ICS Electronics
- GPIB 101–A Tutorial About the GPIB Bus
www.rsleads.com/312ee-589 - Extending the IEEE 488 Bus
www.rsleads.com/312ee-590
Keithley Instruments
- Increase in Automotive Electronics Drives Need for Sophisticated Test Equipment
www.rsleads.com/312ee-591 - Making Better Fuel Cells: Through-Plane Resistivity Measurement of Graphite-Filled Bipolar Plates
www.rsleads.com/312ee-592 - High-Reliability Power Supply Testing
www.rsleads.com/312ee-594 - Switch to 42-Volt Automotive Systems Brings Challenges and Opportunities
www.rsleads.com/312ee-595
LeCroy
- LAB WM764 The Processing Web
www.rsleads.com/312ee-596 - LAB WM205 XXL Memory-100 Msamples
www.rsleads.com/312ee-597 - LAB WM510 Custom Masks for SDA
www.rsleads.com/312ee-598 - LAB WM812 Customize Your Scope
www.rsleads.com/312ee-599 - LAB WM206 Using Memory Effectively
www.rsleads.com/312ee-600 - Why Differential?
www.rsleads.com/312ee-601 - Advances in Oscilloscope Technology
www.rsleads.com/312ee-602 - Advances in Probing Technology for Capture of High-Frequency Signals
www.rsleads.com/312ee-603 - Using a Digital Oscilloscope for Signal Analysis Including a Practical Example of PLL Characterization
www.rsleads.com/312ee-604
National Instruments
- Test Approaches for Wireless Applications
www.rsleads.com/312ee-606 - Choosing the Right RF Measurements and Instruments for Your Application Needs
www.rsleads.com/312ee-607 - Measure Real Power With a Digital Multimeter
www.rsleads.com/312ee-608 - Measure the Noise on a Power Supply Outlet
www.rsleads.com/312ee-609
QuadTech
- LCR Measurement Primer (2nd Edition)
www.rsleads.com/312ee-611
TDA Systems
- Lossy Line Simulation and Analysis
www.rsleads.com/312ee-613 - Computing Self and Mutual Capacitance and Inductance Using Even and Odd Mode TDR Measurements
www.rsleads.com/312ee-614 - Measurement of Input and Output Die Capacitance for M-LVDS and Other Signaling Standards Using TDR
www.rsleads.com/312ee-615 - Eye Diagram Measurements Using TDR Oscilloscope Transmission Data
www.rsleads.com/312ee-616 - Signal Integrity Modeling of Gigabit Backplanes, Cables, and Connectors Using TDR
www.rsleads.com/312ee-617 - Signal Trace and Power Plane Shorts Fault Isolation Using TDR
www.rsleads.com/312ee-618 - S-Parameters, Insertion, and Return Loss Measurements Using TDR Oscilloscopes
www.rsleads.com/312ee-619 - Choosing Signal Integrity Measurement Tools: Time or Frequency Domain?
www.rsleads.com/312ee-620 - TDR Primer
www.rsleads.com/312ee-621
ADC
- DSX Fundamentals—Connecting to Your Network
www.rsleads.com/312ee-622 - Navigating Circuit to Packet Network Migration
www.rsleads.com/312ee-623 - High-Performance Connectors: Questions and Answers
www.rsleads.com/312ee-624 - The Challenges of Apex Offset in APC Connectors
www.rsleads.com/312ee-625 - Connector Return Loss to a Master vs. Intramated
www.rsleads.com/312ee-626 - Fiber Connectorization—Field vs. Factory Termination
www.rsleads.com/312ee-627 - Singlemode Fiber Connector Endface Workmanship
www.rsleads.com/312ee-628 - Optical Connector Tuning and Testing
www.rsleads.com/312ee-629 - Structured Cabling Improves Data Center Reliability and Performance
www.rsleads.com/312ee-631
Aeroflex
- P25 Trunking
www.rsleads.com/312ee-635 - Testing SmartNet™/SmartZone™ Systems
www.rsleads.com/312ee-636
Agilent Technologies
- Lowering Cost and Improving Interoperability by Predicting Residual BER: Theory, Measurements, and Applications (AN 1397-1)
www.rsleads.com/312ee-638 - IEEE 802.11 Wireless LAN PHY Layer (RF) Operation and Measurement (AN 1380-2)
www.rsleads.com/312ee-639 - Debugging Parallel RapidIO Designs with the Agilent 16700 Series Logic Analysis System
www.rsleads.com/312ee-640
automationtechies.com
- Introduction to Ethernet
www.rsleads.com/312ee-641 - Multi-Segment Ethernet Networks
www.rsleads.com/312ee-642 - Introduction to Switch Technology
www.rsleads.com/312ee-643
Cadence Design Systems
- Modeling Traces for Multi-Gigabit Data Transmission in PCBs
www.rsleads.com/312ee-644
EXFO Burleigh Products Group
- Introduction to Nanopositioning Motors
www.rsleads.com/312ee-645 - Accurately Measure Laser Spectral Characteristics
www.rsleads.com/312ee-646 - Laser Spectral Analysis Made Easy
www.rsleads.com/312ee-647
ILX Lightwave
- Selecting and Using Thermistors for Temperature Control
www.rsleads.com/312ee-648 - Optimize Testing for Threshold Calculation Repeatability Using the LPA-9080 Parameter Analyzer
www.rsleads.com/312ee-649 - The Differences Between Threshold Current Calculation Methods Using the LPA-9080 Parameter Analyzer
www.rsleads.com/312ee-650 - Optimizing TEC Drive Current
www.rsleads.com/312ee-651 - Degree of Polarization as a Function of Measurement Bandwidth
www.rsleads.com/312ee-652 - Determining the Polarization Dependent Response of the FPM-8210 Power Meter
www.rsleads.com/312ee-653 - Triboelectric Effects in High Precision Temperature Measurements
www.rsleads.com/312ee-654 - Voltage Drop Across High-Current TEC Interconnect Cable
www.rsleads.com/312ee-655
Keithley Instruments
- Combining Fiber Alignment and Device Characterization Helps Laser Diode Module Manufacturers Reduce Production Costs
www.rsleads.com/312ee-656 - Telecommunications Test Equipment Must Meet Tight Space Demands While Providing High Throughput and Accuracy
www.rsleads.com/312ee-657 - Advanced Test Equipment Can Shorten Time to Market for New Fiber Optic Communications Gear
www.rsleads.com/312ee-658 - Resistive Temperature Detectors: An Alternative to Thermocouples for Precise, Repeatable Temperature Measurements
www.rsleads.com/312ee-659 - Selecting Telecommunication Test Equipment to Maximize Throughput and Accuracy
www.rsleads.com/312ee-660 - Statistical Process Control of Wireless Device Manufacturing Requires Production-Worthy S-Parameter Measurements
www.rsleads.com/312ee-661
LeCroy
- Physical Layer Testing of PCI-Express Signals Using Consecutive Bits
www.rsleads.com/312ee-662 - Jitter Measurements in Serial Data Signals
www.rsleads.com/312ee-663 - Testing Serial Data Signals
www.rsleads.com/312ee-664
Optronic Laboratories
- LED Measurement
www.rsleads.com/312ee-665
RADCOM
- Introduction to CDMA2000 1x/1x-EV-DO
www.rsleads.com/312ee-666 - Guaranteeing Carrier-Grade Performance
www.rsleads.com/312ee-667 - Practical Applications for RADCOM’s VoIP Test Suites
www.rsleads.com/312ee-668 - VoIP Gateway Testing
www.rsleads.com/312ee-669
Systran Corp.
- Analyzing FPDP Communications for Optimum Performance
www.rsleads.com/312ee-670 - Enhanced Performance in Fibre Channel Communications
www.rsleads.com/312ee-671 - Optimizing Data Storage Performance for Fibre Channel Networks
www.rsleads.com/312ee-672
Tektronix
- Troubleshooting Base Station and User Equipment Interactions in W-CDMA Networks
www.rsleads.com/312ee-673 - Testing W-CDMA Uplink Signals for Conformance With 3GPP RF Tx Specifications
www.rsleads.com/312ee-674 - CDMA Network Technologies: A Decade of Advances and Challenges
800-426-2200 - Identify Failures and Quality Problems in GPRS Networks
800-426-2200 - Challenges in CDMA2000 1x Base Transceiver Station Testing
800-426-2200 - A Guide to Standard and High-Definition Digital Video Measurements
800-426-2200
Telebyte
- Equivalence of 26-AWG and 24-AWG Wire Over VDSL Frequencies
www.rsleads.com/312ee-675 - Accuracy Requirements of Local Loop Simulators
631-423-3232 - Cable Modeling and Fallacy in Use of Spools of Wire
631-423-3232
Texas Instruments
- Evaluation Criteria for ADSL Analog Front End
www.rsleads.com/312ee-676
Agilent Technologies
- Optimizing Power Product Usage to Speed Design Validation Testing (AN 1434)
www.rsleads.com/312ee-677 - Measuring Jitter in Digital Systems (AN 1448-1)
www.rsleads.com/312ee-678 - Jitter Analysis Techniques for High Data Rates (AN 1432)
www.rsleads.com/312ee-679 - Finding Sources of Jitter With Real-Time Jitter Analysis (AN 1448-2)
www.rsleads.com/312ee-680 - Jitter Solutions for Telecom, Enterprise, and Digital Designs
www.rsleads.com/312ee-681
automationtechies.com
- Introduction to Strain and Strain Measurement
www.rsleads.com/312ee-682
Cadence Design Systems
- Modeling and Simulation for Signal Integrity
www.rsleads.com/312ee-683 - Anatomy of a Signal Integrity Failure
www.rsleads.com/312ee-684
Keithley Instruments
- Keithley DC/RF Technology Implementation Backgrounder
www.rsleads.com/312ee-685
LeCroy
- LAB WM421 Modulation Analysis-PWM
www.rsleads.com/312ee-686 - LAB WM428 Power-Real and Apparent
www.rsleads.com/312ee-687 - LAB 439 Control Loop Analysis
www.rsleads.com/312ee-688 - The Accuracy of Jitter Measurements
www.rsleads.com/312ee-689
OPTICOM
- State-of-the-Art Voice Quality Testing
www.rsleads.com/312ee-690
QuadTech
- The Components Collection
www.rsleads.com/312ee-711
Texas Instruments
- Calculating Noise Figure and Third-Order Intercept in ADCs
www.rsleads.com/312ee-712 - Calculating Noise Figure in Op Amps
www.rsleads.com/312ee-713
Data Acquisition
Interactive Circuits and Systems
- Network-Centric Sensor Data Acquisition
www.rsleads.com/312ee-737 - ICS daqPC for the Ultimate in Acquisition, Archiving and Processing
www.rsleads.com/312ee-738 - Radio Signal Recording/Playback With ICS daqPC
www.rsleads.com/312ee-739
Agilent Technologies
- In-Circuit Debug of FPGAs
www.rsleads.com/312ee-714 - On-Chip Design Verification With Xilinx FPGAs
www.rsleads.com/312ee-715 - Optimizing Bluetooth Device Battery Drain Measurements in Manufacturing
www.rsleads.com/312ee-716 - Using Battery Drain Analysis to Improve Device Operating Time
www.rsleads.com/312ee-717
Cadence Design Systems
- Viewing Load Lines in Model Integrity
www.rsleads.com/312ee-718 - A Design Technology for Today
www.rsleads.com/312ee-719 - Solution Space Analysis for High-Speed Design
www.rsleads.com/312ee-720
California Instruments
- Understanding AC Power Source Measurements (APN 106)
www.rsleads.com/312ee-721 - Understanding AC Source Specifications and Terminology (APN 105)
www.rsleads.com/312ee-722
Data I/O
- Designing With High-Density Flash Memories
www.rsleads.com/312ee-723
EnerSys Reserve Power
- Critical Power
www.rsleads.com/312ee-724
Frequency Devices
- Analog and Digital Products Filter Design Guide
www.rsleads.com/312ee-725
Keithley Instruments
- New Materials–New Reliability Issues
www.rsleads.com/312ee-726
Kulicke & Soffa
- Experimental and Numerical Simulation Study of Heat Sinks With Impingement Flow at High Reynolds Numbers
www.rsleads.com/312ee-727
OMEGA
- Technical Reference Series: TRANSACTIONS
www.rsleads.com/312ee-728
QuadTech
- The Materials Collection
www.rsleads.com/312ee-729
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Published by EE-Evaluation Engineering
All contents © 2002 Nelson Publishing Inc.
No reprint, distribution, or reuse in any medium is permitted
without the express written consent of the publisher.
December 2003
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