The IC100-S Mixed-Signal Tester incorporates an I²C serial interface to 3.4 MHz and a SPI serial interface to 20 MHz and performs wafer probe and final test, incoming inspection, device characterization, failure analysis, reliability testing, and general-purpose lab work. It features up to 16 SMUs, 16 digital drivers with programmable VIH, 16 digital receivers with programmable Vt, 24-bit ADC, 32 independent loadboard relays, and five user-defined 16-bit DACs with ±10-V outputs.
The IC100-S includes fill-in-the-blanks software for intuitive test development, curve-tracer software, summary sheets, datalogs, a prober/handler interface, an integrated computer, and a lightweight test head. Every signal has an internal relay that automatically opens and closes so multiple instruments may be shorted together at the DUT without interfering with each other.
