The V93000 Smart Scale™ is a generation of systems and pin cards for testing advanced semiconductor designs including 3-D device architectures and ICs for the 28-nm technology node. Each pin runs with its own clock domain, providing test coverage by matching the data rate requirements of the DUT. Each of the four Smart Scale tester classes, designated A, C, S, and L, has a different test head size and is seamlessly compatible with the others.
Three new digital channel cards have been developed for the testers. The Pin Scale 1600 Digital Card and Pin Scale 1600-ME (memory emulation) Card offer data rates ranging from DC to 1.6 Gb/s. The new small-form-factor cards incorporate clock-domain-per-pin™, protocol-engine-per-pin™, PRBS per pin, and SmartLoop™ testing capabilities for symmetrical high-speed interfaces and provide DC capabilities.
Verigy, an Advantest Group company
