Autotestcon 2015 sets keynote speakers

IEEE Autotestcon is set to convene November 2-5 at the Gaylord National Convention Center in National Harbor, MD. The conference theme is “Increased Mission Effectiveness through Advanced Test & Support Technology.”

Organizers have announced two keynote speakers. John Johns, Deputy Assistant Secretary of Defense (Maintenance), will speak Tuesday November 3 during an 8 to 10:30 a.m. session, and Dr. James Truchard, president and CEO of National Instruments, will speak during a Wednesday morning 8 to 10:30 a.m. session.

Johns provides oversight, policy, and guidance on the DoD $80 billion weapons system maintenance program. In past assignments, he has served the Army and Navy in technology development, engineering, program management, and logistics positions. He holds a Bachelor of Science degree in aerospace engineering from Penn State University and a Master of Science degree in aeronautics and astronautics from Purdue. He is also a graduate of the National Security Management Program, National Defense University.

Dr. Truchard cofounded NI in 1976. Named an Innovation Agent by Fast Company, he has focused on enabling engineers and scientists to solve the world’s grand engineering challenges.

Dr. Truchard has been elected to the Royal Swedish Academy of Engineering Sciences and the National Academy of Engineering and has been elected an IEEE Fellow. He holds a doctorate in electrical engineering and master’s and bachelor’s degrees in physics from the University of Texas at Austin. Prior to cofounding NI, Dr. Truchard served as the managing director of the acoustical measurements division at the UT Applied Research Laboratories.

For more on this year’s event visit http://autotestcon.com/

For a review of news from last year’s event, called Autotest and held September 15-18, 2014, in St. Louis, see these articles:

About the Author

Rick Nelson

Rick Nelson

Contributing Editor

Rick Nelson is a technical journalist who has served as executive editor of Test & Measurement World, chief editor of EDN, and executive editor of EE-Evaluation Engineering. He has also contributed to publications including Vision Systems Design and Electronic Design, and he has participated in many live panel discussions and webcasts. Rick has also held systems-engineering and product-development positions at General Electric and Litton Industries. He received his B.S.E.E. degree from The Pennsylvania State University.

Sign up for our eNewsletters
Get the latest news and updates

Comment About the Article

To join the conversation, and become an exclusive member of Electronic Design, create an account today!