Rosenheim, Germany. Multitest announced that its new high-power Kelvin contactor for strip test successfully passed a long-term evaluation for a high-volume automotive application at an Asian manufacturing site of a global IDM. The high yield and contactor pin lifespan enable favorable OEE (overall equipment efficiency) and a lower overall cost of test, the company reported.
The evaluation ran for over a year using an SO150 package for a high-current automotive application requiring high volumes. Multitest said the results proved the high performance of this contacting solution: >99% first-pass yield and a contact pin life span of more than 1 million insertions.
The Multitest High Current Strip Contactor addresses two critical requirements: high-power carrying capability and the limited space in a high parallel test set up. Usually, strip contactors are based on vertical probe designs, which cannot meet the electrical and thermal requirements of high current applications. The new contactor is based on the established Multitest ecoAmp cantilever design and deliveries superior electrical performance and temperature accuracy.
About the Author
Rick NelsonRick Nelson
Contributing Editor
Rick Nelson is a technical journalist who has served as executive editor of Test & Measurement World, chief editor of EDN, and executive editor of EE-Evaluation Engineering. He has also contributed to publications including Vision Systems Design and Electronic Design, and he has participated in many live panel discussions and webcasts. Rick has also held systems-engineering and product-development positions at General Electric and Litton Industries. He received his B.S.E.E. degree from The Pennsylvania State University.
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