The IEEE EMC Society Philadelphia Chapter will meet October 26 from 5:30 p.m. to 7:30 p.m. at AR RF/Microwave Instrumentation in Souderton, PA. Refreshments will be served during a 5:30 p.m. to 6 p.m. networking session. Featured speakers include Don Heirman, beginning at 6 p.m., and Sangam Baligar, beginning at 6:45 p.m.
Heirman, president of Don HEIRMAN Consultants LLC, will explore the EMC standards activity of national and international standards development committees. He will comment on the immunity and emission standards of the International Electrotechnical Commission as well as on the status of a variety of EMC national standards produced by ANSI ASC C63. He will also address the status of specific IEEE EMC Society standards being developed.
Baligar is an applications engineer for AR RF/Microwave Instrumentation’s radiated and conducted immunity systems and test software. He will explain that traditional radiated immunity testing to IEC61000-4-3 for commercial products, for example, requires 1% steps from 80 MHz to 6 GHz—a process that can become time-consuming and costly. He will discuss a test technology that lets you test up to 10 times faster.
To register visit http://bit.ly/EMCSocietyAR2017.