We’ll let you decide: “Is it an IP test evolution or revolution?” Whatever the outcome, change is afoot on the way to develop test, supply test to others, reuse test, integrate test features, validate test, and target tests to manufacturing. IP providers, chip integrators, verification and validation, test and product engineering, failure analysis, board test, and system testing will be affected by the new IEEE Std. 1149.1-2013 and IEEE Std. P1687...
Register or Sign in below to download the full article in .PDF format, including high resolution graphics and schematics when applicable.
Sponsored Recommendations
Sponsored Recommendations