Organizers of the International Test Conference have announced two additional keynote speakers, who will complement the Tuesday October 31 plenary address by Robert Klosterboer, executive vice president and general manager of the Analog Solutions Group at ON Semiconductor.
On Wednesday November 1, Sanu Mathew, senior principal engineer at Intel’s Circuits Research Lab in Hillsboro, OR, will deliver a talk titled “Ultra-low Energy Security Circuit Primitives for IoT Platforms.” And on Thursday November 2, Joachim Kunkel, a general manager at Synopsys Inc., will deliver a talk titled “Look mom! No hands!”
On Wednesday, Mathew of Intel will contend that low-area energy-efficient security primitives are “…key building blocks for enabling end-to-end content protection, user authentication and data security in IoT platforms.” His talk will describe energy-efficient techniques that enable seamless integration into area- and battery-constrained IoT systems. He will present implementations including a 2,040-gate AES accelerator achieving 289 Gb/s/W efficiency in 22 nm CMOS and a hardened hybrid physically unclonable function (PUF) circuit to generate a 100% stable encryption key. He will also comment on the challenges of maintaining the integrity of security circuits while still enabling testability and post-silicon validation.
As for Thursday’s talk by Kunkel of Synopsys, you may think the “no hands” mention in his title refers to autonomous vehicles, and you would be at least partly right. He will focus on the race toward ever smaller process technologies for advanced automotive semiconductors, driven by assisted and autonomous driving systems. He will contend that the massive functionality enabled by 16-nm and below FinFET semiconductor processes, combined with the new fault mechanisms they bring along, present significant test and repair challenges. Beyond that, automotive functional safety requirements add another dimension to the problem. He will describe automotive test and repair requirements and solutions in the context of automotive functional safety from the perspective of a test-automation tool and IP provider.
Visit http://www.itctestweek.org/ for more information and to register.
