Organizers of the Third IEEE International Workshop on Automotive Reliability & Test have issued a preliminary call for papers. The workshop will focus on the test and reliability of automotive and mission-critical electronics, including design, manufacturing, burn-in, and system-level integration and in-field test, diagnosis, and repair. It will also address architectures and methods for reliable and safe operations under different environmental conditions. With increasing system complexity, security, stringent runtime requirements for functional safety, and cost constraints of a mass market, the reliable operation of electronics in safety-critical domains is still a major challenge.

ART will take place in conjunction with the IEEE International Test Conference (ITC) on November 1 – 2, 2018, in Phoenix, AZ, and is sponsored by the Test Technology Technical Council (TTTC) of IEEE Computer Society. This third edition of the ART Workshop offers a forum to present and discuss these challenges and emerging solutions among researchers and practitioners alike.

Organizers have cited several topic areas:

• functional safety and security in the automotive domain;
• automotive standards and certification;
• ISO 26262;
• approximate computing and artificial intelligence;
• multilayer dependability evaluation;
• verification and validation of automotive systems;
• fault tolerance and self-checking circuits;
• aging effects on automotive electronics;
• resiliency by application;
• dependability challenges of autonomous driving and e-mobility;
• power-up, power-down, and periodic test;
• system-level test;
• built-in self-test (BIST and SBIST) in automotive systems;
• reuse of test infrastructure;
• functional and structural test generation;
• high-quality volume test and minimizing DPPM; and
• life-cycle test-cost minimization.

The submission deadline is Sept. 7, 2018. Visit http://ART.tttc-events.org for more information.