UTAC and AEM to Jointly Develop Next-Gen CMOS Image Sensor Test Solutions

May 19, 2020
The effort will create application-specific test solutions that are scalable and adaptable for future product lines.

UTAC Holdings and AEM Holdings will collaborate and jointly develop next-generation, cost-effective test system solutions for CMOS Image Sensor products. The effort will create application-specific test solutions that are scalable and adaptable for future product lines. This partnership also sets the foundation for increased cooperation and future growth for both companies.

Sponsored Recommendations

Comments

To join the conversation, and become an exclusive member of Electronic Design, create an account today!