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Anritsu Claims First VNA Capable of 70 kHz to 220 GHz Measurements in a Single Sweep

July 16, 2020
VectorStar ME7838G Broadband VNA addresses device characterization requirements in emerging RF and microwave communication systems

Anritsu will demonstrate its latest Vector Network Analyzer (VNA) at three major institutes and universities in Europe this year, with further events to follow in 2021. The live demos, in Switzerland, France and Sweden, will showcase Anritsu’s VectorStar ME7838G broadband VNA, presented as the first such device capable of making measurements from 70 kHz to 220 GHz in a single sweep. The ME7838G, together with MPI’s 200mm probe station, allows on-wafer measurements that span into the upper mmWave frequencies for more accurate device characterization. 

The first stop on the tour is in July and August at ETH Zurich at the Institute of Electromagnetic Fields (IEF) in Switzerland, which researches the wave and particle characteristics of electromagnetic fields at all frequencies. From September 21st , engineers can see the demo at the Université Grenoble Alpes in France at its department of Centre Interuniversitaire de MicroElectronique et Nanotechnologies (CIME), and in November, the demo will be hosted by Chalmers University of Technology in Sweden at its department of Microtechnology and Nanoscience. 

The VectorStar-based broadband system characterizes devices from near-DC to well beyond the operating frequency, allowing more accurate modeling. The VectorStar ME7838x series enables performance analysis of devices ranging from transistors in an on-wafer environment, to communication systems in commercial or defense applications. 

Features and benefits of the Anritsu VectorStar ME7838G include: 

-Frequency coverage to 220 GHz, with extensions to 1.1 THz

-Eliminates the concatenation process across the RF, microwave, and mmWave bands 

-Modular architecture allows system to grow as needed 

-Reduces the risk of waveguide band-extrapolation error in device modelling

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