Marvin Test Solutions announced that its TS-900e-5G mmWave Production Test System has been selected by Teledyne e2v HiRel Electronics for RF mmWave device test. Part of Marvin Test Solutions’ GENASYS Semi suite of flexible, configurable, semiconductor test solutions, the TS-900e-5G 's compact footprint is the ideal test solution for semiconductor manufacturing, device verification, incoming inspection, wafer probing and packaging / test vendors needing a cost-effective, configurable mmWave test system.
Delivering laboratory quality measurements at production speeds, the TS-900e-5G Series are the only test systems available today with independent, non-multiplexed multi-site test performance up to 53 GHz. Production proven 44 GHz signal delivery to the device under test (DUT) makes these test systems the ideal solution for high throughput 5G mmWave device test. “We’re proud to have been selected by Teledyne e2v HiRel for RF mmWave device test,” said Major General Stephen T. Sargeant, USAF (Ret.), CEO of Marvin Test Solutions. “Their expertise in the field of producing high-reliability semiconductor devices for rigorous applications such as military and space meant that they needed an equally high-reliability test solution.”
“Teledyne e2v is advancing in the exciting areas of high-speed RF product testing in support of our customer roadmaps,” said Sanmukh Patel, VP of Engineering for Teledyne e2v HiRel. “We are pleased to select Marvin Test Solutions’ TS-900e-5G for our test solution for RF mmWave testing up to 40 GHz.” GENASYS Semi 5G mmWave solutions deliver exceptional flexibility and compatibility with industry leading probe stations, device handlers and manipulators ensuring simplified integration with existing semiconductor production test equipment. Load board assemblies are designed to support manual device insertion, or interface to an automated handler.
The TS-900e-5G testers offer a very small footprint, operate from single-phase power, are air cooled, and deliver industry-leading 4 to 20 independent (non-multiplexed) VNA ports. All test systems are supplied with the ATEasy Test Executive and Development Studio, as well as instrument drivers, virtual instrument panels, and ICEasy test software tools to facilitate device test development and characterization. The TS-900e-5G series is part of Marvin Test Solutions’ GENASYS Semi suite of semiconductor test systems that offer exceptional quality, value, and flexibility for packaged and wafer device test / characterization, pilot production and focused production test, as well as automated failure analysis and test.