Magma, UMC Complete 65-nm Library Characterization Effort

Jan. 7, 2007
UMC has characterized its internally developed libraries for process geometries of 65 nm and smaller using Magma's SiliconSmart. The libraries support composite current source (CCS) and effective current source model (ECSM) formats.

UMC has characterized its internally developed libraries for process geometries of 65 nm and smaller using Magma's SiliconSmart, a complete library characterization and publishing system that produces production-ready models with minimal setup effort. The libraries support composite current source (CCS) and effective current source model (ECSM) formats and are developed to give customers timing and noise enhancements in their nanometer designs.

According to UMC, use of SiliconSmart resulted in comprehensive libraries characterized by faster throughput, better accuracy and more automation. Setup of SiliconSmart is automated for most complex cells and I/Os while an easy-to-use .tcl interface is available for customization.

SiliconSmart characterizes standard cells, I/O cells, and embedded memories to provide robust timing, low-power, and signal integrity models in a variety of industry standard formats. When used with popular construction and verification tools, these models offer silicon predictability and designer productivity.

For more information, visit www.magma.com and www.umc.com.

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