SystemC Model Library Makes TLM Reuse Easier

Feb. 16, 2006

Would-be users of transaction-level models (TLMs) and electronic system-level (ESL) design approaches in general face a major hurdle. Traditionally, it has been difficult to construct TLMs that serve the needs of early software development, hardware designers, and system architects. These users need somewhat different views of the system to do their jobs. To date, TLMs haven't translated well among those views. With the release of a standards-based modeling library, CoWare gives users of its ConvergenSC ESL design tools an infrastructure for user-defined and highly reusable TLMs of system peripherals. The SystemC Modeling Library (SCML) helps separate TLM communication, storage, timing, and behavior within the peripheral model, making code more modular and more efficient to develop and test. Models can be defined simply and annotated for timing when required.

Unlike proprietary modeling approaches, SCML is based on current IEEE SystemC, Open SystemC Initiative, and Open Core Protocol International Partnership standards. This helps protect users' modeling investments. Also, new TLM platform examples and transactors come standard with ConvergenSC to shorten the learning curve and to provide a starting point for designers.

ConvergenSC, with its native SystemC architecture, can support the multiple levels of abstraction required for platform-driven ESL design. As a result, the tool allows reuse of user-defined SCML peripherals across design tasks and in combination with a broad range of SystemC processor and peripheral IP.

The ConvergenSC Platform Architect package, including SCML, starts at $35,000 per seat for a one-year license. ConvergenSC Model Designer, including SCML, starts at $10,000.

CoWare
www.coware.com

About the Author

David Maliniak | MWRF Executive Editor

In his long career in the B2B electronics-industry media, David Maliniak has held editorial roles as both generalist and specialist. As Components Editor and, later, as Editor in Chief of EE Product News, David gained breadth of experience in covering the industry at large. In serving as EDA/Test and Measurement Technology Editor at Electronic Design, he developed deep insight into those complex areas of technology. Most recently, David worked in technical marketing communications at Teledyne LeCroy. David earned a B.A. in journalism at New York University.