Manufacturability Checker And DFM Optimizer Form Two-Pronged Assault On Systematic IC Failures

Dec. 15, 2006
After a three-year development effort, Clear Shape Technologies has hung out its shingle as a design-for-manufacturing (DFM) technology house with systematic process variability as its target. Two flag-ship products will take a dual approach to addressin

After a three-year development effort, Clear Shape Technologies has hung out its shingle as a design-for-manufacturing (DFM) technology house with systematic process variability as its target. Two flag-ship products will take a dual approach to addressing a leading cause of yield loss at 90 nm and below.

InShape is a model-based, full-chip design-manufacturability checker that predicts accurate silicon shapes. Its model-based, nonlinear optical transformation algorithm quickly and accurately detects potential manufacturing failures during physical design that would otherwise be found after tape-out in mask or silicon.

The compact models encapsulate all necessary reticle-enhancement technology (RET), optical-proximity correction (OPC), mask, etch, and lithography effects on both device and interconnect. They also predict accurate contours for the entire chip from drawn layout in a matter of hours.

The OutPerform silicon-correlated electrical DFM analysis and optimization tool plugs into existing flows for cell design, IP, custom analog, and cell-based digital design. It takes in the designers timing and place and route data, along with encrypted fab technology files, and identifies timing and leakage parametric hotspots for violations due to systematic variations.

Additionally, its timing optimization directives drive the place and route tools. OutPerform gets its silicon-accurate critical dimensions (CD) for devices and interconnects from InShape.

Pricing for both InShape and OutPerform starts at $300,000 each per master license per year. Both tools are available on Linux platforms.

Clear Shape Technologies
www.clearshape.com

About the Author

David Maliniak | MWRF Executive Editor

In his long career in the B2B electronics-industry media, David Maliniak has held editorial roles as both generalist and specialist. As Components Editor and, later, as Editor in Chief of EE Product News, David gained breadth of experience in covering the industry at large. In serving as EDA/Test and Measurement Technology Editor at Electronic Design, he developed deep insight into those complex areas of technology. Most recently, David worked in technical marketing communications at Teledyne LeCroy. David earned a B.A. in journalism at New York University.

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