Library Compiler Validates Current-Source Libraries

April 9, 2007
Updates to Synopsys’ Library Compiler library-characterization tool now enable current-source library validation, correlation, compaction, and model translation, all with near-HSpice simulation accuracy.

Updates to Synopsys’ Library Compiler library-characterization tool now enable current-source library validation, correlation, compaction, and model translation, all with near-HSpice simulation accuracy.

Current-source modeling is a key technology that significantly increases library accuracy by modeling new effects that have emerged at process technologies of 65 nm and smaller. Widespread adoption of this modeling technology has been hindered by the lack of library quality-assurance tools, a multifold increase in data size, and multiple standards. To address these challenges, Synopsys has enhanced Library Compiler to include a suite of library quality-assurance, compaction, merging, scaling, and model translation functions.

Using the open-source Liberty Composite Current Source (CCS) models, these Library Compiler capabilities give library developers greater flexibility in delivering verified libraries at scaled voltage or temperature corners for tool flows from multiple vendors. Library Compiler helps ensure high-quality CCS models for end users by performing automated validation and closed-loop correlation checking between PrimeTime and the HSpice simulator. Library Compiler can also create legacy non-linear delay models (NLDMs) or other third-party current-source models from CCS models, since they are a universal superset.

Library Compiler is available today, with the newest functionality enhancements in limited customer availability in the 2007.03 release. General availability will commence with the 2007.06 release.

Synopsys

www.synopsys.com

About the Author

David Maliniak | MWRF Executive Editor

In his long career in the B2B electronics-industry media, David Maliniak has held editorial roles as both generalist and specialist. As Components Editor and, later, as Editor in Chief of EE Product News, David gained breadth of experience in covering the industry at large. In serving as EDA/Test and Measurement Technology Editor at Electronic Design, he developed deep insight into those complex areas of technology. Most recently, David worked in technical marketing communications at Teledyne LeCroy. David earned a B.A. in journalism at New York University.

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