Sensor technology Transceivers All Products DC-DC converters Intelligent power modules (IPM) Low noise amplifiers (LNAs) Home and building automation Consumer electronics Consumer electronics Industrial Industrial Smart home and building iMOTION™ software & tools Software Archive Platforms Simulation & Modeling Software Login Register Close { "default" : { "title" : "Login or register", "description" : "Please log in with an existing account or create a new one." }, "bookmark" : { "title" : "Save your favorite pages in one place!", "description" : "Log in or create a myInfineon account to bookmark this page and access it anytime from your dashboard. " }, "gated_document" : { "title" : "Unlock unlimited access to valuable documents!", "description" : "Log in or sign up to download this document and enjoy unlimited access to valuable resources." }, "gated_video" : { "title" : "Access exclusive videos!", "description" : "Log in or create a myInfineon account to watch this video and explore more video content and downloads. Don’t miss out—register now!" }, "event_registration" : { "title" : "Register for the event today!", "description" : "To register for this event, you’ll need a myInfineon account. Log in or sign up to secure your spot and access event materials and updates. " }, "board_registration" : { "title" : "Easily register your board!", "description" : "To register this board, you'll need a myInfineon account. Log in or create a myInfineon account and access tailored content related to your product. " }, "block_diagram" : { "title" : "Save your block diagram!", "description" : "Log in or sign up for a myInfineon account to save this block diagram. Your saved diagrams will be stored in your personalized dashboard for easy access and sharing. " }, "contact_sales" : { "title" : "Get personalized sales support!", "description" : "Log in or create a myInfineon account to connect with your dedicated sales expert." }, "subscribe_to_newsletter" : { "title" : "Stay updated!", "description" : "Log in or or create a myInfineon account to receive the latest product updates and insights." }, "add_to_cart" : { "title" : "Access your shopping cart!", "description" : "Log in or create a myInfineon account to manage your cart and simplify your checkout process." }, "request_sample" : { "title" : "Request free-of-charge samples!", "description" : "Corporate or university account required to request free-of-charge samples. Log in or create an account with corporate email address to request samples." } } Share in WeChat Scan the QR code with your WeChat App to share this page. IR HiRel Radiation Testing and Reports Radiation testing is a crucial process for ensuring the reliability and safety of devices, particularly those used in high-radiation environments. For older generation devices, such as the R4, Single Event Effect (SEE) testing using heavy ions was conducted at Brookhaven National Laboratory's Tandem Van De Graff facility, with the goal of initiating an SEE event to establish a safe operating area. However, with the limitation of beam energy up to 500 MeV, a higher energy beam became available at the Cyclotron Institute of Texas A&M University, allowing for testing of newer devices with beam energy of up to 2.2 GeV. This enables the range at Bragg's peak to be near the sensitive area of the device under test, providing more accurate results. The devices tested, including IR HiRel's MOSFETs, are designed to withstand total ionizing dose from 100 krad to 1 Mrad without damage, and are subjected to heavy ions with a Linear Energy Transfer (LET) of 37-92 MeV·mg/cm2, with beam energy ranging from 300 MeV to 2.2 GeV. The Single Event Effects (SEEs) observed in MOSFETs include Single Event Burnout (SEB) and Single Event Gate Rupture (SEGR), while other components like gate-drivers and PWM controllers may be vulnerable to Single Event Transient (SET), Single Event Latchup (SEL), and Single Event Functional Interrupt (SEFI). It is worth noting that SEB, SEGR, and SEL are destructive events, whereas SET and SEFI are typically non-destructive. The characterization of SEE is typically expressed as a function of LET, with typical testing levels for radiation-hardened devices ranging from 37-92 MeV·mg/cm2. Commonly used test ions include Krypton (84Kr), Xenon (129Xe), and Gold (197Au), with kinetic energy ranging from 100 MeV to 2.2 GeV. Share in WeChat Scan the QR code with your WeChat App to share this page. Rad hard GaN Rad Reports Share in WeChat Scan the QR code with your WeChat App to share this page. Rad hard ICs Rad Reports Share in WeChat Scan the QR code with your WeChat App to share this page. Solid State Relay Rad Reports Share in WeChat Scan the QR code with your WeChat App to share this page. Still have questions? Get help from the Infineon Developer Community Find answers or ask questions. Connect with engineers across the globe, help solve technical challenges, and share knowledge with each other.