EE Product News

Memory Test System Handles Full Spectrum Of Memory Designs

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The per-pin design and new software tools broaden the MS4205 General-Purpose memory Test System application to include a full spectrum of memories from simple SRAM and DRAM through SBSRAM, Flash, and DDR SDRAM. The test system combines the best functionality and features of the firm's MS3400 testers with the performance and precision of its MS4100 synchronous memory test systems. The MS4205 can leverage previous work on the company's testers by supporting file import and the MS3400's and MS4100's test programs.
The test system features an optimized user interface that meets test needs in design verification, device characterization, product qualification, process monitoring, yield enhancement, failure analysis, quality assurance, and product engineering. The system is housed in a lab-sized, floor-standing cabinet with a lightweight remote test head mounted on a stand.

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