Featured in this week’s roundup are a family of Micro-D connectors with removable crimp contacts that fit aerospace and defense systems, and a single-chip motor-driver IC for EV subsystems. Other highlights include a source measurement unit (SMU) with up to 20 channels for testing semiconductor devices and a series of automotive-grade FRAM chips for data logging.
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James Morra is the senior editor for Electronic Design, covering the semiconductor industry and new technology trends, with a focus on power electronics and power management. He also reports on the business behind electrical engineering, including the electronics supply chain. He joined Electronic Design in 2015 and is based in Chicago, Illinois.
