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The challenges in testing EMI during early product cycle are multifold. In our free step-by-step guide, we break down the whole EMI design test process into “Locate”, “Capture”, and “Analyze”. With this guide, you are now able to discover and analyze EMI in a more systematic and methodical approach to solve your problems.
This article describes the advantages of open-loop sensors over closed-loop current sensors. Examples of LEM and Honeywell open-loop sensors are described.
