A key challenge for embedded devices with DDR memories is to maintain signal integrity in the presence of power and ground rail fluctuations.
Accurate ripple and noise measurements on power rails require a high-bandwidth oscilloscope and a dedicated probe to perform low-noise measurements and provide the offset capability to zoom in on top of the DC voltage. The R&S®RT-ZPR20 power rail probe as well as the R&S®RTE and the R&S®RTO digital oscilloscopes are excellent tools for this measurements.
The Renesas RA4L1 MCU group offers 80MHz, 32-bit microcontrollers powered by the Arm Cortex -M33 core with TrustZone. These low-power, general-purpose MCUs are designed to meet...
Explore the future of smart metering and grid infrastructure with Renesas' NWK rack demo. Join Kevin Jones, an applications engineer at Renesas Electronics, as he showcases the...
Discover how Gallium Nitride (GaN) is revolutionizing power systems with superior efficiency and performance. Join our webinar to learn about its benefits, design challenges, ...