Read this brief application note to pick up tips on how to make better current-voltage measurements of Field Effect Transistors (FETs).
Learn how to speed up current-voltage testing on FETs and other semiconductor devices. The test set-up described here saves money because it requires fewer test instruments and enables you to avoid tedious and time consuming test set-up. And it can be applied across a range of FET tests, including I-V tests such as gate leakage, breakdown voltage, threshold voltage, transfer characteristics, drain current, on-resistance, and more.
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In a generic electronic system there are some inputs that are controlled by the end user. These inputs are read by electronics and acted upon by using outputs.
