Fusing CMOS IC and MEMS Design for IoT Edge Devices
May 12, 2020
Accommodate single or multiple die techniques for successful IoT edge device design and verification.
Designers are now creating IoT edge devices that span across analog, digital, RF, and MEMS domains. They are tackling a challenge that once seemed impossible: combining the electronics of the device using the traditional CMOS IC flow with the MEMS sensor on the same silicon die. This paper reveals the secret of how designers accomplish this fusion.
This article describes the advantages of open-loop sensors over closed-loop current sensors. Examples of LEM and Honeywell open-loop sensors are described.
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