e-Guide: Simplifying MOSFET and MOSCAP Device Characterization
Aug. 10, 2020
This e-guide answers common questions about making better semiconductor measurements, with a focus on DC I-V and capacitance-voltage (C-V) measurements.
Engineers and researchers are constantly challenged to create new semiconductor technologies or processes or improve existing ones. Whether the challenge is designing a lower power front end for a next-generation smartphone or investigating new materials for high efficiency solar panels, you need test tools and techniques that support making precise electrical measurements with high accuracy and efficiency.
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