Tools for Your Top Millimeter-wave Test Challenges
July 1, 2021
Learn key considerations when tackling the test challenges for today’s and tomorrow’s millimeter-wave applications.
Millimeter-wave technology transforms wireless communications by enabling higher data throughput. It brings a new set of test challenges to the lab including excessive path loss and wideband noise, that degrade measurement accuracy and repeatability.
Download Keysight's white paper, Tackling Millimeter-wave Signal Analysis Challenges, to get the most out of your measurements and see the real performance of your mmWave devices.
Stricter guidelines imposed by version 3 of the IEC standard for harmonic current emissions push designers to embrace power-factor-correction methodologies.
The flyback topology is a versatile, widely used, switched-mode power-supply design with some interesting characteristics that brings performance and BOM advantages to many applications...
