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    Whitepaper: Accelerating Test Pattern Bring-Up for Rapid First Silicon Debug

    Feb. 18, 2019
    This standard silicon bring-up flow is becoming too slow and expensive, especially for very large designs with complex DFT structures. This whitepaper from Mentor Graphics explains how to speed up the silicon bring-up process.
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    Reducing the time spent on silicon bring-up is critical in getting ICs into the hands of customers and staying competitive. Typically, the silicon bring-up process involves converting the test patterns to a tester-specific format and generating a test program that is executed by Automatic Test Equipment (ATE). This standard silicon bring-up flow is becoming too slow and expensive, especially for very large designs with complex DFT structures.

    Download the whitepaper here

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