Semiconductor devices undergo rigorous testing long before they reach the end user, and wafer probe testing is the crucial first step to ensure performance and yield. From verifying simple diodes to probing advanced processors and high-frequency RF devices, accuracy and reliability are paramount.
Automatic test equipment (ATE) must rapidly switch between DC, AC, functional, high-voltage, and high-frequency test conditions while maintaining consistency and precision. Reed relays are at the heart of this process, providing the speed, repeatability, and long service life that modern test systems demand.
This application guide outlines five key reasons why reed relays are the preferred choice for semiconductor testing, supported by real-world examples and product recommendations to suit your application.
Download the full guide to learn how Pickering’s reed relays can increase throughput, reduce downtime, and deliver the accuracy needed for the latest semiconductor technologies.
