Application Note: Solving Connection Challenges in On-Wafer Power Semiconductor Device Test

Measuring DC and capacitance parameters for high power semiconductor devices requires sufficient expertise to optimize the accuracy of various measurements. Even for those with this level of expertise,

managing set-up changes between ON-state, OFF-state and capacitance voltage (C-V) measurements can be time consuming and prone to errors; this is especially true in the on-wafer environment.