Mike's Blog: Quick sights and thoughts from EMC + SIPI 2019

I spent two days of last week (July 23-24) attending the week-long 2019 International Symposium on Electromagnetic Compatibility, Signal + Power Integrity—better known as EMC + SIPI—hosted by IEEE at the Ernest N. Morial Convention Center in New Orleans, LA. Evaluation Engineering was a proud media sponsor of the event.

There, I got more than my fill on the latest product solutions in EMC test and signal/power integrity, and I was able to talk to dozens of vendors about some of the key challenges they're facing when meeting the needs of customers.

Expo-wise, EMC + SIPI isn't a large event, as just shy of 100 vendors filled most of the 103,000 square foot Hall D of the convention center and its 150+ exhibitor booths. But given its title, the show is one of the most focused ones that EE attends throughout the year, putting a spotlight on the aforementioned areas of electronic test & measurement. Nearly every vendor there is involved with EMC/EMI test in some capacity, so it was great to chat with so many experts just a few weeks after our July special report on EMC/EMI receivers & analyzers had gone live (see the print version here).

Of course, the expo was only one facet of EMC + SIPI. The event offered more than 200 technical sessions, workshops & tutorials, hands-on experiments & demonstrations, and other special sessions—many occupying around 30 rooms between the convention center's second and third floors, while others were right on the expo hall floor. All of these combined to provide a wealth of educational opportunities for attendees interested in EMC troubleshooting, testing techniques, technology innovations and challenges, and much more.

Here's a look at some of what I saw around EMC + SIPI: