Vector Software touts integration with Lauterbach TRACE32

May 12, 2015

Vector Software announced today an advanced integration with the Lauterbach TRACE32 product. The VectorCAST test automation platform now enables development, test, and certification teams to set and continuously collect practically unlimited volumes of test data from RAM-constrained embedded systems.

This latest integration benefits customers in aerospace, defense, automotive, medical-device, industrial-control, and commercial environments where software quality and industry compliance are critical. Vector Software’s development team worked closely with Lauterbach and the TRACE32 implementation of IEEE Standard 1149.1-1990 JTAG and IEEE-ISTO 5001-2003 NEXUS.

VectorCAST’s Unit Test Automation and Structural Code Coverage is data driven, making it a test automation platform capable of minimizing the on-target memory requirement for all aspects of test case data where cycles of 100k to 1M or more are required.

The combined capability of VectorCAST and TRACE32 support microprocessors from ARM, Imagination Technologies (MIPS), Freescale/NXP, Fujitsu, Intel, and AMD; microcontrollers from TI (Including Hercules) and STMicroelectronics; DSPs from Analog Devices; and CPLDs from Altera and Xilinx.

“We are very excited to see VectorCAST take advantage of our TRACE32 product’s engineered features,” stated Rudolf Dienstbeck, software developer at Lauterbach GmbH. “This enhancement significantly improves our customers’ debug capability in the most demanding scenarios.”

“With the Lauterbach TRACE32 and the VectorCAST Test Automation Platform’s newly engineered features, we have been able to add two whole new dimensions to our customers’ embedded systems development arsenal—those of time and space,” said Bill McCaffrey, chief operating officer at Vector Software.

www.lauterbach.com

www.vectorcast.com

About the Author

Rick Nelson | Contributing Editor

Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.

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