Foothill Ranch, CA. Chroma Systems Solutions Inc., a provider of power-conversion testing equipment and automated systems, announced that it will exhibit at IEEE Autotestcon, scheduled September 12-15, 2016, in Anaheim, CA. Engineering representatives will be available to discuss Chroma’s family of power-conversion test instrumentation and systems designed for R&D, design verification, production, and incoming inspection.
Chroma offers power-conversion, electrical-safety, and component testing-lab equipment in power-supply, battery, energy-storage, electric-vehicle, PV-inverter, LED, medical, defense, aerospace, and commercial applications.
Autotestcon brings together the military and aerospace automatic test industry and government and military acquirers and users to share new technologies, discuss innovative applications, and exhibit products and services.
Showcased will be Chroma’s newly released 63200A programmable DC electronic loads. Designed for testing a range of power-conversion products including AC/DC and server power supplies, DC/DC converters, EV batteries, automotive charging stations, and other power electronics components, these loads can be synchronously paralleled up to 480 kW and dynamically synchronized for generating complex multichannel transient profiles. The 300% peak overpower capability provides extra headroom for fault condition simulations in automotive batteries and fuel cells.
Advantages of the 63200A series include ultrahigh density power (6 kW in 4U), dynamic frequency sweep with variable frequencies up to 50 kHz, built in digital microprocessors, master/slave parallel control, sine-wave dynamic loading, and measurement accuracy 0.015%+0.015% FS, 0.04%+0.04% FS, and 0.1%+0.1% FS accuracy for voltage, current, and power measurement respectively. The entire 63200A series is available in units from 3 kW to 24 kW at 150-V, 600-V, or 1,200-V voltage ranges with 2,000-A maximum current range per unit. Operation can be achieved by the front panel or from a remote workstation via standard USB or optional Ethernet and GPIB interfaces.
About the Author
Rick NelsonRick Nelson
Contributing Editor
Rick Nelson is a technical journalist who has served as executive editor of Test & Measurement World, chief editor of EDN, and executive editor of EE-Evaluation Engineering. He has also contributed to publications including Vision Systems Design and Electronic Design, and he has participated in many live panel discussions and webcasts. Rick has also held systems-engineering and product-development positions at General Electric and Litton Industries. He received his B.S.E.E. degree from The Pennsylvania State University.
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