Test Platform Snoops Next Gen Networks

May 2, 2005
Supporting a plethora of test configurations for next-generation transport and datacom applications, the TestPoint platform includes tests for traffic loading, impairment injection, error reporting, information capture, and performance

Supporting a plethora of test configurations for next-generation transport and datacom applications, the TestPoint platform includes tests for traffic loading, impairment injection, error reporting, information capture, and performance characterization. Transport protocols include SONET/SDH, VCAT for Ethernet over SONET/SDH, and G.709. Additionally, the system provides datacom capabilities for 1- and 10-Gigabit Ethernet, GFP, and ATM. The platform consists of three instruments: the TS-170, TS-30, and the TS-10. Offered as scalable chassis, the TS-170 is a 17-slot chassis and the TS-30 is a 3-slot model. Both support hot swapping, and all test modules include a 10/100 Base-T port and clocking functions. An optional group-controller module provides a single point of access when multiple modules are present. Debuting as the latest member, the TS-10 is a self-contained test instrument for 10-Gigabit Ethernet benchtop and mobile applications. It hosts an interface supporting up to five 10G line rates. INNOCOR, Ontario, Canada. (800) 675-1915.

Company: INNOCOR

Product URL: Click here for more information

About the Author

Staff

Articles, galleries, and recent work by members of Electronic Design's editorial staff.

Sponsored Recommendations

Comments

To join the conversation, and become an exclusive member of Electronic Design, create an account today!