Image

28-nm SRAM Tests Confirm 50% Reduction In Power

April 23, 2014
Early testing of SureCore’s low-power SRAM design revealed more than 50% power savings over other SRAM technologies.

Early testing of SureCore’s low-power SRAM design revealed more than 50% power savings over other SRAM technologies. The British startup achieved right-first-time silicon at 28 nm and the performance analysis correlated well with simulated data.

SureCore’s patented circuit architecture for energy-efficient memory was born from detailed circuit analysis, architectural improvements, and the use of advanced statistical models. The technology-independent SRAM solution, which can be applied to bulk CMOS, FinFET, and FD-SOI technologies, could double battery life for emerging low-power applications in the mobile, networking, and wearable technology markets.

SURECORE

About the Author

Staff

Articles, galleries, and recent work by members of Electronic Design's editorial staff.

Sponsored Recommendations

Comments

To join the conversation, and become an exclusive member of Electronic Design, create an account today!