Image

Rad-Hard Voltage References Ensure Signal Integrity

July 29, 2014
Intersil expanded its line of rad-hard voltage references with four new devices: the ISL71091SEH10, 20, 33, and 40. Providing voltages previously unavailable for the rad-hard space market (10, 2.048, 3.3 and 4.096 V respectively), the references enhance overall accuracy for 11- and 12-bit ADC resolution applications.

Intersil expanded its line of rad-hard voltage references with four new devices: the ISL71091SEH10, 20, 33, and 40. Providing voltages previously unavailable for the rad-hard space market (10, 2.048, 3.3 and 4.096 V respectively), the references enhance overall accuracy for 11- and 12-bit ADC resolution applications.

Improved output voltage noise and a reference voltage that’s stable over time, temperature, and ionizing radiation boosts precision in satellite data-acquisition, signal-processing, and power-management applications. By incorporating the company’s SOI-based PR40 process, the devices deliver single-event latch-up (SEL) immunity to ensure robust performance in heavy ion environments.

The family features very low output noise with an initial voltage accuracy of 0.05%. Voltage accuracy is ±0.15% over temperature (-55 to +125°C) and ±0.25% ionizing radiation. Temperature coefficient measures 6 ppm/°C.

On-chip sinking capability eliminates the need for buffering; the devices can source 10 mA and sink 5 mA. Each device comes in a compact 8-lead flatpack.

INTERSIL

About the Author

Staff

Articles, galleries, and recent work by members of Electronic Design's editorial staff.

Sponsored Recommendations

Comments

To join the conversation, and become an exclusive member of Electronic Design, create an account today!