Part 1 of this article showed how an active current-sink circuit can address all the requirements for testing high‑current, low-voltage power supplies. However, successful implementation of this circuit does present some design challenges. Careful selection of the circuit components is critical to the performance and durability of the final electronic load circuit.
MOSFET Selection
The power transistor must be chosen to provide fast response while also withstanding high power dissipation. Several electrical and thermal characteristics must be considered.