Our March issue, now online, includes features on mil/aero ATE, LTE test, smart power, semiconductor yield enhancement, AXIe, PXI, remote monitoring, and signal generation.
In our special report this month, Tom Lecklider writes, “MIL/Aero ATE systems with RF/microwave test capabilities are designed to be used for a number of years before being upgraded or replaced. However, the need to continue supporting legacy test program sets (TPS) greatly influences upgrade/replace decisions. Sometimes, these are prompted by test-instrument obsolescence. Other times, technology becomes available that could significantly improve the original ATE specification.” Whatever your upgrade or replace decision, Lecklider has some hints.
Companies involved in wireless communications markets are also facing legacy issues. Our cover story takes a look at the equipment available to help chipset vendors, mobile-device manufacturers, and telecommunications companies roll out LTE—implementing technologies like MIMO and carrier aggregation while maintaining compatibility with 3G and 2G networks.
The issue also included a feature on smart power and the importance of power meters, analyzers, and monitors that can help ensure that your smart power really is. Other articles address wireless networking for remote-monitoring applications, boosting semiconductor yield and ROI, and the relationship between AXIe and PXI. In addition, we provide a summary of National Instruments' 2012 Automated Test Outlook, and in honor of EE-Evaluation Engineering's 50th anniversary, Tom Lecklider takes a look at signal generation over the years.
And finally, I comment on a potential technological transformation rivaling that wrought by electrification, telephony, and the dawn of the automobile age a century ago.
Visit the online table of contents.
