OptimalTest Highlights OptimalEnterprise Version 5 at ITC

November 12, 2012. OptimalTest chose the International Test Conference to highlight its new OptimalEnterprise Version 5 release. Version 5 targets maximized yield, improved quality and reliability, and better supply-chain collaboration.

The new release includes these specific features:

• An e-test (also known as WAT or PCM) data function, in which data is loaded into the OT database automatically, enables users to map e-test sites to dies on a wafer to enable cross-operation correlation to wafer-sort data. If electronic chip IDs (ECID) are available, the system also automatically maps the data to final-test results.
• Cross-operation reporting combines data from multiple operations into a single report, enabling the analysis of parametric test results across e-test, wafer-sort, and final-test operations.
• Generic data rules let users create rules to monitor a range of variables such as test time, retest rates, throughput, and yield.
• Generic cross rules can compare statistics for a range of entities in the OT database to detect issues such as poorly performing equipment (for example, testers, probers, handlers, probe cards, and load boards).
• An extended S2S (S2Sx) rule signals intermittent hardware failures at the test-site level for systems performing high-parallelism test.
• OT-Portal offers tight integration with SAS Institute's JMP analytical software.
• OT-Proxy can collect nonnumeric test data.

In addition, Version 5 extends support for MES data systems to include wafer-sort data. It also supports test-time-reduction (TTR) simulation, engineering, and debugging. A new schema for parametric test-results data reduces storage-space requirements by up to 30% while offering 70% improvement in datalog loading performance and up to a tenfold performance improvement for some parametric queries.

View related article.