Agilent Launches Bench-top Boundary Scan Analyzer

February 19, 2013. Agilent Technologies Inc. has announced the launch of the Agilent x1149 boundary-scan analyzer, which it is exhibiting at IPC APEX EXPO. The x1149 boundary-scan analyzer is a versatile yet easy-to-use board-test tool designed to help users through board design and validation; they can reusing the same x1149 test in manufacturing.

Offering an intuitive interface, the analyzer makes all information easily available on the screen with one mouse click. Key features include

  • Cover-Extend technology and Silicon Nails capability,
  • STAPL player for CPLD/FPGA tests,
  • Scan Path Linker to link multiple chains into a single chain, and
  • fully compliant device support for IEEE 1149.1 and IEEE 1149.6 standard.

“In an iNEMI survey, 90% of the respondents agreed that built-in self test, or BIST, is critical for product testing, while 60% of board designers said they are requesting the use of BIST to validate the board’s performance. The access method to the BIST is predominantly via boundary scan,” said Boon Khim Tan, general manager for Agilent’s Measurement Systems Division.

“The x1149 boundary-scan analyzer is Agilent’s response to the industry’s call for more BIST,” he said. “We continue to focus on enabling the best return on investment for our customers, and the x1149 is a case in point. It is a versatile instrument that can be used throughout the product development cycle, from design and validation to high-volume production—all with the same test transportability, reliability and stability that are the hallmarks of our solutions.”


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